Decoupling Method of Deterioration Mechanism of Metallized Film Capacitors Under AC-DC Composite Voltage
A metallized film and composite voltage technology, applied in the direction of instruments, measuring electricity, measuring electrical variables, etc., can solve the problems of unclear influence weight, wrong capacitor design and application method, affecting capacitor reliability and life prediction, etc., to achieve practical Strong performance, simple decoupling method, and long-term stable operation effect
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[0025] In order to make the objectives, technical solutions and advantages of the present invention clearer, the present invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention, but not to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not conflict with each other.
[0026] The decoupling method for the degradation mechanism of the metallized film capacitor under the AC / DC composite voltage provided by the present invention includes:
[0027] S1. Prepare a wire capacitor with the same parameters as the metallized film capacitor; the wire capacitor is composed of two metallized films without edges and then sprayed with gold at both ends; the electrode of the wire...
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