Test resource management method capable of supporting parallel tests

A technology of test resources and management methods, applied in the field of intelligent configuration management, can solve problems such as test instrument state disorder, achieve good scalability, and save hardware costs

Inactive Publication Date: 2013-05-01
THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The present invention proposes a test resource management method supporting parallel testing, which solves the problem in the prior art that the state of the test instrument is disordered when multiple test programs access the same test instrument at the same time

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  • Test resource management method capable of supporting parallel tests
  • Test resource management method capable of supporting parallel tests
  • Test resource management method capable of supporting parallel tests

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Embodiment Construction

[0019] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0020] The present invention proposes a test resource management method supporting parallel testing, the system structure of the method is as follows figure 2 As shown, the structure includes the following parts: bearer server 21 , test resource manager component 22 , resource configuration file 23 and test resource configuration editor 24 . Each part is described in detail below:

[0021] The test resource manager component 22 is responsible for managing all tes...

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Abstract

The invention provides a test resource management method capable of supporting parallel tests in order to solve the problem of the prior art that a test instrument is in a messy state when multiple test programs access the same test instrument. With the test resource management method capable of supporting the parallel tests, provided by the invention, a user can simply and quickly develop a test program capable of orderly and effectively access the resources of the test instrument. The test resource management method not only supports the access of the multi-thread parallel test instrument, but also supports the access of the multi-process test instrument. The instrument resources of the system are effectively utilized, and the hardware cost is greatly saved. As long as the configuration is simply modified by a graphical interface program, the test instrument can be added or changed without modifying the test program. In other words, the method has great expandability, configurability and instrument interchangeability.

Description

technical field [0001] The invention relates to the technical field of testing, in particular to a method for intelligently configuring and managing testing resources in an automatic testing system. Background technique [0002] The test resource management program is mainly used to manage the software and hardware information of various test resources in the automatic test system. It is a very important auxiliary program in the automatic test system, especially for complex general automatic test systems. . Of course, for some small automatic test systems, due to the lack of test resources, the test program is dedicated, and parallel testing rarely occurs, so some test programs do not provide a test resource management program, and the test program directly accesses the instrument through the driver program. Condition. [0003] The current common test resource management program only manages the static information of the hardware and software in the automatic test system, ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F13/12
Inventor 胡宝刚
Owner THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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