Test resource management method for supporting parallel test

A technology of test resources and management methods, applied in the field of intelligent configuration management, can solve problems such as test instrument state disorder, achieve good scalability, and save hardware costs

Inactive Publication Date: 2013-06-19
THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The present invention proposes a test resource management method supporting parallel testing, which solves the problem in the prior art that the state of the test instrument is disordered when multiple test programs access the same test instrument at the same time

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  • Test resource management method for supporting parallel test
  • Test resource management method for supporting parallel test
  • Test resource management method for supporting parallel test

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Embodiment Construction

[0019] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0020] The present invention proposes a test resource management method supporting parallel testing, the system structure of the method is as follows figure 2 As shown, the structure includes the following parts: bearer server 21 , test resource manager component 22 , resource configuration file 23 and test resource configuration editor 24 . Each part is described in detail below:

[0021] The test resource manager component 22 is responsible for managing all tes...

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Abstract

The invention provides a test resource management method for supporting a parallel test. The test resource management method for supporting the parallel test solves the problem that a test instrument is in a disordered state when a plurality of test programs access an identical test instrument at the same time in the prior art. A user can simply and rapidly develop out a test program for accessing test instrument resources in order and effectively by utilizing the test resource management method for supporting the parallel test. The test program can not only support a multithreading parallel test instrument to access, but also support a multiprocess parallel test instrument to access. Instrument resources of a system can be effectively used and hardware cost is largely saved; a graphical interface program can be simply used for modifying configuration so as to achieve adding and replacing of the test instruments and the test program is not needed to be modified. Namely, the method has excellent expandability, configurability and instrument interchangeability.

Description

technical field [0001] The invention relates to the technical field of testing, in particular to a method for intelligently configuring and managing testing resources in an automatic testing system. Background technique [0002] The test resource management program is mainly used to manage the software and hardware information of various test resources in the automatic test system. It is a very important auxiliary program in the automatic test system, especially for complex general automatic test systems. . Of course, for some small automatic test systems, due to the lack of test resources, the test program is dedicated, and parallel testing rarely occurs, so some test programs do not provide a test resource management program, and the test program directly accesses the instrument through the driver program. Condition. [0003] The current common test resource management program only manages the static information of the hardware and software in the automatic test system, ...

Claims

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Application Information

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IPC IPC(8): G06F13/12
Inventor 胡宝刚
Owner THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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