Space charge measuring device for dielectric long-term aging process

Abstract

The invention relates to a space charge measuring device for a dielectric long-term aging process and belongs to the technical field of space charge measurement of solid dielectric. The space charge measuring device comprises a bracket, a rotary table, a common ground electrode, a high-voltage direct power supply and multiple space charge measuring mechanisms, wherein the multiple space charge measuring mechanisms are uniformly distributed along the circumference of the rotary table, the high-voltage direct current power supply is connected with the high-voltage direct current protection resistors of the high-voltage electrodes of the multiple space charge measuring mechanisms, a sample to be measured is arranged between a high voltage output electrode and an electric-acoustic pulse ground electrode, the high-voltage output end and the low-voltage output end of a pulse source are respectively connected with the high-voltage electrodes and a oscilloscope, an amplifier is connected with a sensor and the oscilloscope, and a computer is connected with the oscilloscope through a signal wire. With the adoption of the space charge measuring device for the dielectric long-term aging process, the test efficiency is greatly improved, and a large amount of test cost is saved.

Description

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AI Technical Summary

Benefits of technology

This patented technology allows for more efficient testing of materials with high capacitance values undergoing stress ageing processes compared to previous techniques such as destructive tests or nonlinear optical absorption spectroscopy (NOAA). It also includes an improved method called pectin analysis, where different types of molecules are analyzed separately from one another instead of being combined together at once beforehand. By combining these two technologies into a single unit, this new technique will increase overall accuracy and reduce cost when studying material properties.

Problems solved by technology

The technical problem addressed by this patented method relates to studying the effects of different environmental stressors (such as temperature) upon the degradation behavior of insulated material used inside high voltages transmission lines such as overhead cables or submarine optic fibers. This can lead to failure overtime and potential safety hazards associated with these structures.

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