A defect correlation method and device

A defect and association mode technology, applied in the field of defect association methods and devices, can solve problems such as time-consuming and energy-consuming, and achieve the effect of improving work efficiency and reducing identification work.

Inactive Publication Date: 2016-11-09
BEIJING UNIV OF POSTS & TELECOMM
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

If a static defect detection tool reports 6,000 defects for a certain software, and each defect requires 1.5 minutes of manual time to review, then a developer needs to work continuously for 18.75 days to review all of them (8 hours a day), so consuming a lot of time and energy

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  • A defect correlation method and device
  • A defect correlation method and device
  • A defect correlation method and device

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Embodiment Construction

[0061] In order to understand the characteristics and technical content of the present invention in more detail, the implementation of the present invention will be described in detail below in conjunction with the accompanying drawings. The attached drawings are only for reference and description, and are not intended to limit the present invention.

[0062] figure 1 It is a schematic flow diagram for implementing the defect correlation method of the present invention, such as figure 1 As shown, the method includes the following steps:

[0063] Step 101: Extract the code block corresponding to the defect from the defect report, and generate a defect-related code block sequence information base according to the extracted code block.

[0064] Here, the defects in the defect report include: defect number, defect type, related variable name, variable declaration code, variable assignment code, defect occurrence code, etc.

[0065] This step specifically includes:

[0066] Extr...

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Abstract

The invention discloses a defect association method. The method comprises the following steps: extracting a code block corresponding to the defect from a defect report, generating a defect relevant code block sequence information base according to the extracted code block, obtaining a basic frequency sub-sequence of the defect relevant code block sequence information base, and removing the frequency sub-sequence dissatisfying a constraint condition in the basic frequency sub-sequence; grouping the defect in the defect report according to the defect corresponding to the current frequency sub-sequence, and refining the grouped defect according to the predetermined defect association pattern. The invention further discloses a defect association device. By adopting the technical scheme provided buy the invention, the defect can be grouped accurately.

Description

technical field [0001] The invention relates to defect correlation technology in computers, in particular to a defect correlation method and device. Background technique [0002] Defect detection generally includes two stages: static defect detection and manual review. Static defect detection tools can detect defects in software and generate defect reports. For the defect report output by the static defect detection tool, developers need to manually review one by one to judge whether the defect is true, or whether the defect is important enough to be repaired by the developer. [0003] A large number of defect outputs, false positives, and an excessive proportion of unimportant defects will inevitably cause developers to spend a lot of experience reviewing defect reports. It is usually the developer's responsibility to evaluate the defect to determine whether it is pertinent. However, the speed of handling these defects is usually not very high. According to the testing e...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/36
Inventor 金大海宫云战张大林黄俊飞王雅文
Owner BEIJING UNIV OF POSTS & TELECOMM
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