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Frequency spectrum simulation method for magnetic head noise testing process and magnetic head noise testing method

A technology of noise test and simulation method, applied in the field of spectrum simulation, head noise test, and test head noise field, can solve the problems of incompatible batch head mass test, long time consumption of dynamic test method and low test efficiency, etc. The effect of high test efficiency, short time consumption and high test accuracy

Active Publication Date: 2013-08-14
SAE MAGNETICS (HK) LTD
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Problems solved by technology

However, the dynamic test method takes a long time, so the test efficiency is very low, and it is not suitable for mass testing of mass heads

Method used

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  • Frequency spectrum simulation method for magnetic head noise testing process and magnetic head noise testing method
  • Frequency spectrum simulation method for magnetic head noise testing process and magnetic head noise testing method
  • Frequency spectrum simulation method for magnetic head noise testing process and magnetic head noise testing method

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Embodiment Construction

[0049] Hereinafter, several different preferred embodiments of the present invention will be described with reference to the accompanying drawings, in which the same reference numerals in different figures represent the same components. As mentioned above, the essence of the present invention lies in a method of spectrum simulation in the process of head noise testing and a method of testing head noise using the spectrum simulation method, which can use a quasi-static testing machine to detect the noise generated by the head in a higher frequency bandwidth. , Thereby saving test time, improving test efficiency and improving test accuracy.

[0050] figure 1 It is a separate magnetic head slider, which shows the magnetic head on it, and the dynamic testing machine 30 for performing the head noise test. As shown in the figure, the reference number 20 is a magnetic head slider that is independently separated. The tail surface of the magnetic head slider 20 is an element forming surf...

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Abstract

The invention discloses a frequency spectrum simulation method for a magnetic head noise testing process, which includes the following steps: (11) a dynamic tester is adopted for detecting multiple magnetic heads within the scope of a first frequency bandwidth, so that multiple first noise observation diagrams are obtained; (22) each first noise observation diagram is divided into two noise curves based on a preset frequency bandwidth, namely a first noise curve and a second noise curve, wherein the scope of the frequency bandwidth of the first noise curve is smaller than that of the second noise curve; (33) each second noise curve is fitted into a mathematical equation; and (44) a correlation equation is established among the multiple mathematical equations, so that the second noise curve of each magnetic head can be simulated. According to the method, the second noise curves of the noise observation diagrams within higher frequency bandwidth can be simulated, and the correlation equation can be established according to the second noise curves, so that testing time is saved, testing efficiency is improved and testing accuracy is improved.

Description

Technical field [0001] The present invention relates to a recording disk drive unit, in particular to a noise test method of a magnetic head in the disk drive unit, and a spectrum simulation method used therein. More specifically, the present invention relates to a method for testing magnetic head noise using a static testing machine at a higher frequency bandwidth. Background technique [0002] As the capacity and size of disk drive devices gradually increase, thin-film magnetic heads with higher sensitivity and high resolution are currently required to meet this demand. For example, the giant magnetic effect (GMR) thin film magnetic head that is widely used now has a GMR read head element including a multilayer structure of a fixed magnetization layer and a magnetization free layer; another example is the tunnel magnetoresistance effect that is now being put into practical use. (TMR) Thin film magnetic head, which has a TMR read head element with higher sensitivity and higher ...

Claims

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Application Information

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IPC IPC(8): G11B5/455
Inventor 林浩基雷卓文梁钊明张启超陈华俊丁菊仁倪荣光
Owner SAE MAGNETICS (HK) LTD
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