Measurement device for radar target polarized scattering matrix

A polarization scattering matrix and radar technology, which is applied in the field of new radar target polarization characteristic measurement devices, can solve the problems of complex polarization scattering matrix measurement devices and high purchase cost, and achieves fast calculation speed, low cost, and structural design. simple effect

Inactive Publication Date: 2014-03-19
UNIT 63892 OF PLA
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  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Aiming at the disadvantages of the existing polarization scattering matrix measurement device being complex and expensive to purchase, the present invention provides a new radar target polarization scattering matrix measurement device

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  • Measurement device for radar target polarized scattering matrix
  • Measurement device for radar target polarized scattering matrix
  • Measurement device for radar target polarized scattering matrix

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Embodiment Construction

[0030] The present invention will be described in detail below in conjunction with the accompanying drawings.

[0031] The principle of the present invention is: according to the radar antenna theory, the polarization characteristics of the radar antenna change during the azimuth scanning process, and the polarization mode of the antenna radiation field changes with the change of the space pointing, that is, the polarization pattern of the antenna during the scanning process has A certain change rule is called the "space polarization characteristic" of the antenna. Utilizing the spatial polarization characteristics of the antenna, designing a new polarization measurement device can greatly reduce the system complexity and R&D cost of polarization measurement, and enable the traditional single-polarization radar to have polarization measurement capability.

[0032] The present invention first collects the target echo sequence data in the antenna scanning process, and obtains th...

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Abstract

The invention provides a measurement device for a radar target polarized scattering matrix. Firstly, target echo sequence data are acquired in an antenna scanning process and through windowing processing, echo data of a specific direction region are obtained and then Fourier transformation is performed on the data so that a spatial frequency spectrum of the signal is obtained and then frequency points and peak values of the frequency spectrum are obtained through spectrum estimation; at last, a special-purpose matrix operation digital-signal processor calculates a frequency-spectrum coefficient matrix and performs inverse matrix and multiplication operations and at last an output result of the matrix operation digital-signal processor is the measured target polarized scattering matrix. The measurement device for the radar target polarized scattering matrix is simple in structural design, high in calculation speed, comparatively low in cost and easy to realize.

Description

technical field [0001] The invention relates to a new radar target polarization characteristic measuring device, in particular to a device for realizing the measurement of the radar target polarization scattering matrix by utilizing the change rule of the polarization pattern during the antenna scanning process. Background technique [0002] The basis of radar polarization information processing is polarization measurement. Whether it is radar imaging, polarization filtering, polarization enhancement, polarization anti-jamming, or radar target polarization feature extraction and target recognition, the premise must be able to obtain sufficient accuracy. Polarized signal measurement information. The polarization scattering matrix is ​​the important information of the target characteristics. Accurately obtaining the polarization characteristic information of the target and using it effectively has long been a frontier issue that has attracted much attention in many fields such...

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Application Information

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IPC IPC(8): G01S7/41
CPCG01S7/024G01S7/41
Inventor戴幻尧张晓芬孔德培李金梁焦斌乔会东崔建岭
OwnerUNIT 63892 OF PLA