Prediction and screening method of relay individual working life based on early life performance
A technology of working life and screening method, which is applied in the direction of instruments, electrical digital data processing, special data processing applications, etc., and can solve the problems of shortening the effective service time of relay products, long working life, and short working life
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[0066] Taking the test data of 8 samples of a certain type of normally open contact electromagnetic relay in the complete life test as an example, the method in the present invention is described in detail, including the following steps:
[0067] Step 1: Select a set of performance parameters (attributes) of the sample as comprehensively as possible;
[0068] For this type of relay, select the five performance parameters of bounce time, dynamic fluctuation time, dynamic peak voltage drop, static contact pressure drop, and working life, and record the working life, ambient temperature, bouncing time, dynamic fluctuation time, dynamic peak voltage drop, The static contact pressure drop is D, C in turn 1 、C 2 、C 3 、C 4 、C 5 ;
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