Relay individual working life predicting and screening method based on early life performance
A technology of working life and screening method, applied in instruments, electrical digital data processing, special data processing applications, etc., can solve the problems of shortening the effective service time of relay products, short working life, long working life and so on
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[0066] Taking the test data of 8 samples of a certain type of normally open contact electromagnetic relay in the complete life test as an example, the method in the present invention is described in detail, including the following steps:
[0067] Step 1: Select a set of performance parameters (attributes) of the sample as comprehensively as possible;
[0068] For this type of relay, select the five performance parameters of bounce time, dynamic fluctuation time, dynamic peak voltage drop, static contact pressure drop, and working life, and record the working life, ambient temperature, bouncing time, dynamic fluctuation time, dynamic peak voltage drop, The static contact pressure drop is D, C in turn 1 、C 2 、C 3 、C 4 、C 5 ;
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