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Photochromic parameter statistical method and apparatus

A statistical method and parameter technology, applied in computing, electrical digital data processing, special data processing applications, etc., can solve the problem of high chip cost

Active Publication Date: 2015-11-25
CHANGZHOU INST OF TECH RES FOR SOLID STATE LIGHTING
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the disadvantage of this method of operation is that the smaller the bin, the higher the cost of the chip
However, in the production and calibration process of lamps, there is a lack of a technical solution that can statistically analyze the light and color parameters of single-color channel or multi-color channel lamps of the same model

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  • Photochromic parameter statistical method and apparatus
  • Photochromic parameter statistical method and apparatus
  • Photochromic parameter statistical method and apparatus

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Embodiment Construction

[0026] Hereinafter, the present invention will be described in detail with reference to the drawings and in conjunction with the embodiments. It should be noted that the embodiments in the application and the features in the embodiments can be combined with each other if there is no conflict.

[0027] In the following description, unless otherwise specified, each embodiment of the present application will be described with reference to symbolic representations of actions and operations performed by one or more computers. Among them, computers include various products such as personal computers, servers, and mobile terminals, and devices with processing chips such as central processing units (CPU), single-chip microcomputers, and digital signal processors (DSP) can all be called computers. From this, it can be understood that such actions and operations sometimes referred to as computer-executed include manipulation of electrical signals that represent data in a structured form by...

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Abstract

The present invention discloses a photochromic parameter statistical method and apparatus. The method comprises: acquiring color coordinates of each monochromatic channel of each of a plurality of calibrated lamps and a mean value and a covariance of each monochromatic channel of the plurality of the calibrated lamps; according to the mean value and the covariance of each monochromatic channel of the plurality of the calibrated lamps, determining whether each monochromatic channel corresponding to one or more lamps that are subjected to calibration processing subsequently meets a preset condition; and according to the color coordinates of each monochromatic channel, which meets the preset condition, of each of the plurality of the calibrated lamps, determining a common color gamut range of the plurality of the calibrated lamps. According to the technical scheme provided by the present invention, statistical analysis can be performed on the photochromic parameters of different lamps same in type, and verification is performed on the quality of the tested lamps according to a statistical result, so that the lamps of which the quality does not meet requirements are filtered in time.

Description

Technical field [0001] The present invention relates to the field of industrial design, and in particular to a method and device for statistics of light color parameters. Background technique [0002] At present, due to differences in production processes, the light efficiency, light color, and electrical parameters of different light emitting diode (LED) chips of the same batch and of the same model are different. As a result, even under the same driving signal, different LED chips of the same type emit different colors and intensities. Therefore, different LED chips of the same model need to be grouped before leaving the factory, which is the so-called "binning". [0003] In the actual operation process, the more detailed the binning operation is, the smaller the color difference of the light emitted by the chips in the same bin, and the higher the color identity of different lamps formed by the chips in the bin. However, the disadvantage of this operation mode is: the smaller ...

Claims

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Application Information

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IPC IPC(8): G06F19/00
Inventor 董建飞李琳琳吴海宁吴俊杰张国旗
Owner CHANGZHOU INST OF TECH RES FOR SOLID STATE LIGHTING
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