Spectrum reconstruction method based on weighted measurement matrix

A measurement matrix and spectral reconstruction technology, applied in the field of spectral reconstruction and spectral reconstruction based on weighted measurement matrix, can solve the problems of large color difference and low spectral reflectance reconstruction accuracy, and achieve small color difference and high reconstruction accuracy Effect

Active Publication Date: 2017-05-10
UNIV OF SHANGHAI FOR SCI & TECH
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However, only one method is used to reconstruct the spectral reflectance, th

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  • Spectrum reconstruction method based on weighted measurement matrix
  • Spectrum reconstruction method based on weighted measurement matrix
  • Spectrum reconstruction method based on weighted measurement matrix

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[0024] In order to make the technical means, creative features, goals and effects of the present invention easy to understand, the following embodiments will specifically illustrate the weighted measurement matrix-based spectral reconstruction method of the present invention in conjunction with the accompanying drawings.

[0025] figure 1 is a schematic diagram of a spectral reconstruction method based on a weighted measurement matrix in an embodiment of the present invention.

[0026] Such as figure 1 As shown, the reconstruction of spectral reflectance by weighted measurement matrix includes the following steps:

[0027] Step 1 S1, obtain the spectral values ​​of the training samples and the testing samples, that is, use XriteEye-One Pro to measure the spectral values ​​of the training samples and the testing samples, and measure the spectra of the training samples and testing samples The values ​​are saved in Excel format. In this embodiment, the training samples and the ...

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Abstract

The invention provides a spectrum reconstruction method based on a weighted measurement matrix, comprising the following steps: S1, acquiring the spectrum values of a training sample and a test sample; S2, acquiring the camera response values of the training sample and the test sample; S3, reconstructing the spectrum value of the test sample using a pseudo-inverse method, a wiener estimation method and a principal component analysis method respectively, and getting corresponding measurement matrixes; S4, calculating the chromatic aberration between each of the spectrum values obtained through reconstruction using the pseudo-inverse method, the wiener estimation method and the principal component analysis method and the spectrum value of the test sample; S5, weighting and adding the spectrum values obtained through reconstruction using the pseudo-inverse method, the wiener estimation method and the principal component analysis method to get a new spectrum value; S6, calculating the chromatic aberration between the new spectrum value and the spectrum value of the test sample; S7, adding the weight corresponding to the minimum chromatic aberration in S6 to the corresponding measurement matrixes, and adding three values obtained together to get a measurement matrix M; and S8, using the measurement matrix to reconstruct the spectrum value.

Description

technical field [0001] The invention relates to a method for spectral reconstruction, in particular to a method for spectral reconstruction based on a weighted measurement matrix, and belongs to the field of optoelectronics. Background technique [0002] Spectral reflectance is an inherent property of an object. As a method that can describe the color information of the object surface most comprehensively and accurately, it has been widely used in various industries. Different objects have different spectral reflectance. The spectral reflectance of the object surface Expressing the color of an object with high efficiency can reduce problems such as color memerism. [0003] The reconstruction of physical spectral reflectance is of great significance and has a wide range of applications in printing, art reproduction, textile, e-commerce and even medicine. There are many reconstruction methods for spectral reflectance, such as pseudo-inverse method, Wiener estimation method, p...

Claims

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Application Information

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IPC IPC(8): G01J3/28
CPCG01J3/28
Inventor 李贝陈智闻耿润张雷洪梁东康祎潘子兰聂鹏占文杰
Owner UNIV OF SHANGHAI FOR SCI & TECH
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