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Method and device for testing NVDIMM outage protection function

A technology of power-off protection and function, which is applied in the field of testing NVDIMM power-off protection functions, can solve the problems of low NVDIMM test efficiency and limit NVDIMM R&D and production progress, and achieve the effects of improving test efficiency, saving labor costs, and simple operation

Inactive Publication Date: 2018-11-20
ZHENGZHOU YUNHAI INFORMATION TECH CO LTD
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  • Application Information

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Problems solved by technology

[0005] The embodiment of the present invention provides a method and device for testing NVDIMM power-off protection function to solve the problem of low NVDIMM testing efficiency and limiting NVDIMM research and development and production progress in the prior art

Method used

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  • Method and device for testing NVDIMM outage protection function
  • Method and device for testing NVDIMM outage protection function
  • Method and device for testing NVDIMM outage protection function

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Embodiment

[0036] Such as figure 1 As shown, the method for testing the NVDIMM power failure protection function includes the following steps:

[0037] S1, create a partition for NVDIMM, and mount the partition to the test folder;

[0038] Before step S1, some preparatory work is also included: including installing an operating system program for the server, in this embodiment, installing a Linux operating system for the server; creating a test folder under the root directory;

[0039] The specific process of creating partitions for NVDIMM is:

[0040] S11, execute parted / dev / pmem0 to enter the parted mode (partition mode), in the parted mode, execute the mkpart command to start the establishment of a new partition, and set the file system format to ext4;

[0041] S12, set the start position and end position of the core partition, if the start position of the new partition is set to start from 1MB, and the end position is 17GB, then write 1M and 17G in sequence in the script to obtain ...

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Abstract

The embodiment of the invention discloses a method and a device for testing an NVDIMM outage protection function. The method comprises the steps of building a partition for an NVDIMM, and mounting thepartition under a test folder; copying a test file to the test folder, and turning off the power supply of a server during a copying process; and turning on the server after set time, comparing MD5 values before and after the test file is copied, and judging the outage protection function of the NVDIMM. According to the method and device provided by the invention, whether the data protection function of the NVDIMM is correct is judged through comparing the MD5 values before and after the test file is copied, the operation is simple, the data protection function of the NVDIMM can be quickly learned, and the test efficiency is improved,

Description

technical field [0001] The present invention relates to the technical field of NVDIMM ((Dual-Inline-Memory-Modules, dual-inline memory module refers to the new type of memory bar that appeared after Pentium CPU launched) testing technology, specifically a kind of testing NVDIMM power-off protection function method and device. Background technique [0002] Ordinary memory sticks are composed of DRAM (Dynamic Random Access Memory), that is, dynamic random access memory, the most common system memory) particles, and the data in the DRAM particles will be lost when the power is abnormally turned off. NVDIMM adds flash particles and capacitor modules on the basis of ordinary memory stick DRAM particles. When abnormal power failure occurs, the capacitor supplies power to the memory stick to transfer the data in DRAM to flash particles; when the system is powered on again At this time, the data in the flash particles is transferred back to the DRAM, so that the data in the memory ...

Claims

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Application Information

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IPC IPC(8): G06F11/22
CPCG06F11/2205G06F11/2231G06F11/2273G06F11/2284
Inventor 曹加峰
Owner ZHENGZHOU YUNHAI INFORMATION TECH CO LTD
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