Real-time alarming method and device for working condition of electronic test system

Abstract

The invention relates to the technical field of electronic test device alarming, and discloses a real-time alarming method and device for the working condition of an electronic test system. The real-time alarming device adopted by the real-time alarming method comprises a test data interface device, a stack-type memory for storing test data and an alarming information processing system for processing the stored test data; the test data interface device is connected with the stack-type memory through a data transmission cable; the alarming information processing system is used for processing the data stored by the stack-type memory; and the processed test data result is compared with a threshold value to obtain judgment information, and the judgment information is transmitted into an alarming device through the data transmission cable. Subjective experience factors of people can be overcome, and the alarming confidence level can be provided; the working sate of an electronic test devicecan further be reflected to the largest limit in real time, and supersession of the old by the new is continuously conducted; and the difficulty that with increasing of the test data, the modeling operation number is continuously increased can further be avoided.

Description

technical field [0001] The invention relates to the technical field of electronic test equipment alarms, in particular to a real-time alarm method and equipment for working conditions of an electronic test system. Background technique [0002] At present, after a period of use of electronic test equipment, the working status of the equipment often changes, so that the test data will contain large system errors and reduce the credibility of the test data. The terrible thing is that the test equipment is already in this state. , but we can't grasp its real working status, especially the self-developed electronic test system. [0003] In addition, the real-time monitoring of the working status of electronic testing equipment is currently carried out by monitoring the temperature, vibration and other parameters of the equipment. However, in many cases, when the working state of the electronic test equipment changes slightly, this change will cause the test data to contain certa...

AI Technical Summary

Problems solved by technology

However, in many cases, when the working state of the electronic test equipment changes slightly, this change will cause the test data to contain certain systematic errors, but it will not cause changes in parameters such as temperature and vibration, and real-time alarms cannot be performed.

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