16 results about "Electronic test equipment" patented technology

Systems and Methods for capacitance testing of a unit under test with parasitic capacitance directed to a guard rail. The system includes test points, wherein the plurality of test points are divided into at least two groups; a stimulus source; a first group guard relay electrically connected to each of the test points in a first; a second group guard relay electrically connected to each of the test points in a second; a guard rail coupled to the first group guard relay and the second group guard relay; a first group return relay electrically connected to each of the test points in a first group; a second group return relay electrically connected to each of the test points in a second group; a current measurement rail coupled to the first group return relay and the second group return relay; a current meter coupled to the measurement rail; and a controller.

Systems and Methods for capacitance testing of a unit under test with parasitic capacitance directed to a guard rail. The system includes test points, wherein the plurality of test points are divided into at least two groups; a stimulus source; a first group guard relay electrically connected to each of the test points in a first; a second group guard relay electrically connected to each of the test points in a second; a guard rail coupled to the first group guard relay and the second group guard relay; a first group return relay electrically connected to each of the test points in a first group; a second group return relay electrically connected to each of the test points in a second group; a current measurement rail coupled to the first group return relay and the second group return relay; a current meter coupled to the measurement rail; and a controller.

This application discloses an HDMI interface test fixture, relating to the field of electronic testing equipment technology. The embodiments of this application utilize a male clamp and a female recessed plate to directly connect the HDMI interface and testing instruments. Combined with test points set on the differential and small signal lines, this enables rapid testing of the HDMI interface's signal quality, connectivity, and power capability during signal transmission without disassembling the device casing. It has the advantages of strong compatibility, ease of operation, and low cost. The HDMI interface test fixture disclosed in this application is suitable for the R&D and debugging phases of HDMI interfaces, as well as the troubleshooting phases of HDMI interfaces.

A device for testing optical sensors comprises a drone having an electronic control module for autonomous flight operation, a test object attached to or attachable to the drone, and an electronic test device that is in signal communication with the electronic control module and is configured to (i) at least in a sensor test mode, to bring the drone close to an optical sensor in such a way that the test object enters a detection range of the optical sensor, (ii) to determine an operating state of the optical sensor when the test object is present in the detection area, and (iii) to compare the determined operating state with a target operating state.

The invention relates to the technical field of power electronic test equipment, and discloses a flat conductor single-layer vertically-wound inductor and a manufacturing method thereof, and the flat conductor single-layer vertically-wound inductor comprises an upper magnetic plate, a lower magnetic plate and at least one parallel magnetic core arranged between the upper magnetic plate and the lower magnetic plate, two ends of the parallel magnetic core are respectively and magnetically connected with the upper magnetic plate and the lower magnetic plate to form a closed magnetic circuit, the winding unit is wound on the periphery of the parallel magnetic core, and the winding unit is of a spiral winding structure formed by a continuous flat conductor through multiple times of inward bending. And the flat conductor is wound on the parallel magnetic core in a vertical winding manner. The flat conductor is subjected to continuous inward bending, so that the effects of simplifying the process and improving the performance can be achieved, the winding process is simplified by the single-layer vertical winding structure, accurate inward bending only needs to be performed at a specific position, the method is suitable for automatic production, the production efficiency and consistency are remarkably improved, the cost is reduced, and the performance is effectively improved.

Systems and Methods for capacitance testing of a unit under test with parasitic capacitance directed to a guard rail. The system includes test points, wherein the plurality of test points are divided into at least two groups; a stimulus source; a first group guard relay electrically connected to each of the test points in a first; a second group guard relay electrically connected to each of the test points in a second; a guard rail coupled to the first group guard relay and the second group guard relay; a first group return relay electrically connected to each of the test points in a first group; a second group return relay electrically connected to each of the test points in a second group; a current measurement rail coupled to the first group return relay and the second group return relay; a current meter coupled to the measurement rail; and a controller.

The utility model relates to a metal plate connecting piece and electronic test equipment. The metal plate connecting piece comprises a plate body, a supporting lug, a first connecting lug, a second connecting lug, a reinforcing rib and an auxiliary supporting lug, the metal plate connecting piece can be fixed on the upper supporting frame through the second connecting lugs and the fasteners, the metal plate connecting piece, the upper supporting frame and the lower supporting frame jointly form a new support structure, the height of the whole support is increased through the metal plate connecting piece, meanwhile, the original structure of the upper supporting frame and the original structure of the lower supporting frame used for installing all electronic elements can be reserved, and therefore the metal plate connecting piece is convenient to use. The requirement for replacing a large screen can be met only by redesigning the sizes of the outer frame, the front panel and the rear panel, and the mounting mode and the mounting position of each electronic component are kept original, so that each module of the equipment does not need to be redebugged for a long time, the original process and production line for mounting each electronic component do not need to be changed, and the production efficiency is improved. And the requirements of customers are met, and the production cycle and the production cost can be ensured not to be greatly influenced to the greatest extent.

A test apparatus is provided.SOLUTION: The slot assembly is removably attached to the frame. Each slot assembly allows for individual heating and thermal control of a respective cartridge inserted into the slot assembly. A closed loop air path is defined by the frame, and the heater and cooler are located in the closed loop air path to heat or cool the cartridge with air. Individual cartridges can be inserted or removed while other cartridges are at various locations to be tested or at various locations of the temperature gradient.SELECTED DRAWING: Figure 1

This invention discloses an electronic test equipment management system, including an electronic test equipment (1), a test control terminal (2), and a resource management terminal (3). The test control terminal (2) is configured with: a data monitoring module that records "device link records"; and a data monitoring module that records "device access records". The resource management terminal (3) is configured with: an alarm module that issues alarm information after matching "device link records", "device access records" and "predetermined alarm strategies"; and a device status reset module that resets the status of the corresponding electronic test equipment from "in use" to "idle" based on the alarm information. This invention uses the operator's operation on the electronic test equipment as the monitoring object, then analyzes the operation data, and manages the status of the electronic test equipment based on the analysis results.

The invention discloses an efficient heat dissipation power grid simulator, and relates to the technical field of power electronic test equipment. The power grid simulator comprises a case, and an input unit, a power conversion unit, a control unit and an auxiliary unit which are arranged in the case. The case is composed of a ventilation baffle, a side baffle, an upper cover plate and a bottom cover plate which are oppositely arranged. A plurality of parallel insulating plates are arranged in the case, and the length direction of the insulating plates is perpendicular to the ventilation baffle, so that the interior of the case is divided into a plurality of independent ventilation areas. Ventilation grid holes communicated with the ventilation area are formed in the ventilation baffle, and a linear airflow channel is formed. A fan of the auxiliary unit is arranged in the channel and drives airflow to flow in a one-way penetrating mode. Air duct construction, electrical isolation and structure supporting are achieved through integration of the insulating plates, the problems of low heat dissipation efficiency, high insulation safety risk, insufficient mechanical stability and inconvenient maintenance are solved by combining the optimized fan array and the bottom suspension gap, the reliability of equipment is remarkably improved, and the service life of the equipment is remarkably prolonged.

This invention aims to provide a testing device and method for testing magnetic displacement curves. The invention includes a frame housing a camera module, a measurement module, and a carrier module. The measurement module includes a moving component, the moving component's actuating end of which is equipped with a pressure sensor. The pressure sensor is connected to a mounting plate, and the mounting plate houses a magnet carrier. The carrier module includes a rotary motor, the top of which is equipped with a mounting base. The mounting base houses a fixed magnet, and the magnet carrier is positioned above the mounting base. The magnet carrier has a mounting groove, and movable magnets are arranged on all four side walls of the mounting groove. The fixed magnet is located inside the mounting groove. The camera module calibrates the position between the movable and fixed magnets, and the pressure sensor detects the force between the movable and fixed magnets. This invention applies to the technical field of electronic testing equipment.

This invention discloses a printed circuit board (PCB) testing device and its control method, relating to the field of electronic testing equipment technology. The PCB testing device includes a base, a fixed platform, a test probe assembly, a micro-adjustment structure, and a locking mechanism. The fixed platform is located on the base and has a positioning structure for fixing the PCB to be tested onto it. The test probe assembly is located above the fixed platform and includes a mounting base and multiple probe structures mounted on the mounting base. The probe structures are movably mounted horizontally on the mounting base and contact the pins of the PCB on the fixed platform. The micro-adjustment mechanism is located between the mounting base and the fixed platform, allowing the mounting base to move relative to the fixed platform in the vertical and / or horizontal directions. The locking mechanism can lock the micro-adjustment mechanism, ensuring precise displacement and stable adjusted position, offering advantages such as compact structure and high stability.

The invention discloses a high-precision probe station based on composite driving, relates to the technical field of microelectronic test equipment, and aims to solve the technical problem that displacement driving of an existing probe station cannot give consideration to large-stroke rapid movement and nanoscale positioning precision. The X-axis displacement drive, the Y-axis displacement drive and the Z-axis displacement drive of the probe station all adopt a composite drive framework of coarse-precision drive and high-precision drive, a coarse-precision drive unit adopts a common electromagnetic driver to realize hundred-micron large-stroke rapid movement, and a high-precision drive unit adopts a piezoelectric driver to realize nanoscale high-precision positioning. Through cooperative work of a mechanical coupling structure and a closed-loop control module, organic combination of large-stroke rapid approaching and high-precision positioning is realized. In addition, a magnetorheological fluid active damping system is additionally arranged at the position of the supporting leg and used for balancing the influence caused by vibration of the surrounding environment. The device is compact in structure, rapid in response and high in positioning precision, and can be widely applied to high-precision testing scenes such as semiconductor chip testing and micro-nano device characterization.

The utility model relates to the technical field of electronic test equipment, in particular to a pawl spring probe test seat. According to the technical scheme, the device comprises a base, a pawl spring probe is arranged in the base, the pawl spring probe comprises two sets of mounting plates, a plurality of sets of probe assemblies are arranged above each set of mounting plates, each set of probe assembly comprises a needle tube, a needle body is arranged in each needle tube, a needle head is arranged at the top end of each needle body, and the probe head is arranged on the base. A spring is arranged between the mounting end of the needle body and the inner cavity of the needle tube, a stabilizing plate is arranged above the base, a positioning plate is arranged above the stabilizing plate, and buckle assemblies are arranged on the two sides of the stabilizing plate. According to the utility model, through the mutual cooperation of the pawl spring probe and the positioning plate, the versatility and the utilization rate of the product are greatly improved, through the arrangement of the probe head, the contact area and the contact stability between the product and an element to be detected are greatly increased, the problem of poor contact is effectively avoided, and the accuracy of test data is improved.

This utility model provides an upper mold opening protection device for ICT testing equipment, relating to the field of electronic testing equipment technology. It includes a placement base and an opening protection component. The opening protection component includes a guide post connected to the placement base. A protective block is provided on the placement base, and a first limiting groove is formed on the protective block near the guide post. In this utility model, the upper mold is placed inside a limiting shell. When the upper mold opens, the protective block moves with the limiting shell. A compressed first telescopic spring pushes a push block to slide along the first limiting groove, causing the push block to exert force on the guide post. Simultaneously, a locking block is constrained by a second limiting groove within the limiting shell. When the limiting shell moves upward, the locking block rotates and disengages from the placement base, ensuring stable guidance during the opening process. When closing, the guide post pushes the push block to reset, the first telescopic spring is compressed, and the locking block contacts the constraint, causing the locking block to re-engage into the placement base, completing the positioning, achieving rapid response, and ensuring operational safety.

To provide a tester device.SOLUTION: Slot assemblies are removably mounted on a frame. Each slot assembly enables individual heating and temperature control of a respective cartridge inserted into the slot assembly. A closed loop air path is defined by the frame, and a heater and a cooler are located in the closed loop air path to cool or heat the cartridges with air. Individual cartridges can be inserted or removed while other cartridges are in various stages of being tested or in various stages of temperature ramps.SELECTED DRAWING: Figure 1