32 results about "Electronic test equipment" patented technology

Systems and Methods for capacitance testing of a unit under test with parasitic capacitance directed to a guard rail. The system includes test points, wherein the plurality of test points are divided into at least two groups; a stimulus source; a first group guard relay electrically connected to each of the test points in a first; a second group guard relay electrically connected to each of the test points in a second; a guard rail coupled to the first group guard relay and the second group guard relay; a first group return relay electrically connected to each of the test points in a first group; a second group return relay electrically connected to each of the test points in a second group; a current measurement rail coupled to the first group return relay and the second group return relay; a current meter coupled to the measurement rail; and a controller.

The invention relates to the field of electrical measurement and electronic test equipment, and discloses a charger test method and system. The method comprises the following steps: acquiring a parameter configuration set and a baseline condition, and generating a probe and interface configuration structure under a four-wire system measurement site, protocol abstraction card mapping and shunting and Hall channel combination condition; performing unified time reference binding and event labeling table initialization, locking a time base by a real-time clock of the microcontroller unit, broadcasting the time base to a channel and a controller, executing temperature rise constrained load arrangement and synchronous acquisition, and generating an acquisition preparation packet; and electrical transient and thermal feature extraction and electrical decoupling fusion are executed, and consistency judgment, threshold comparison and report generation are completed. According to the invention, by establishing a unified time base architecture of electricity and heat dual-domain synchronization, multi-channel consistent acquisition and real-time self-diagnosis are realized, the precision, traceability and automation level of a charger test process are improved, and the method is suitable for comprehensive test and evaluation of various types of electronic equipment.

The invention discloses a multi-performance test device, and relates to the technical field of electronic product detection, the multi-performance test device comprises a machine table, a rotating disc, a plurality of detection devices and a carrying mechanism, the machine table is provided with a feeding station, a plurality of detection stations and a discharging station which are arranged at intervals in the circumferential direction of the machine table; the rotary table is rotationally installed on the machine table along the axis extending in the vertical direction, the rotary table is provided with at least one installation position, and in the rotating process of the rotary table, the installation positions can pass through the feeding station, the multiple detection stations and the discharging station; the plurality of detection devices are respectively located at the plurality of detection stations, and the plurality of detection devices comprise an electronic test device, a visual detection device and an elastic force test device; the carrying mechanism is arranged on the machine table and comprises a carrying part moving in the vertical direction and the horizontal direction, and the carrying part is used for moving out the electronic products flowing to the discharging station. The equipment can be conveniently matched with a production line, and the overall operation efficiency and the product quality control level of the production line can be effectively improved.

The invention discloses a control method of electronic test equipment and the electronic test equipment, and relates to the technical field of electronic products, and the control method of the electronic test equipment comprises the following steps: obtaining identification information of the electronic products to confirm a detection sequence; controlling a resistance test probe, a capacitance test probe and an insulation test probe to work in sequence according to a detection sequence so as to obtain test data of the electronic product, and comparing the test data with a preset condition to obtain a test result. Through a multi-parameter parallel measurement mode, the corresponding probes can be controlled to automatically switch the test modes according to the detection sequence, the electronic test requirements can be met, the requirements of different electronic product detection sequences can be matched, and the scheme can perform real-time analysis and comparison on multi-parameter test data through a unified data processing center. According to the invention, the process which needs to be completed by a plurality of independent test devices originally is integrated into one platform, so that the test process of the electronic product is optimized.

Systems and Methods for capacitance testing of a unit under test with parasitic capacitance directed to a guard rail. The system includes test points, wherein the plurality of test points are divided into at least two groups; a stimulus source; a first group guard relay electrically connected to each of the test points in a first; a second group guard relay electrically connected to each of the test points in a second; a guard rail coupled to the first group guard relay and the second group guard relay; a first group return relay electrically connected to each of the test points in a first group; a second group return relay electrically connected to each of the test points in a second group; a current measurement rail coupled to the first group return relay and the second group return relay; a current meter coupled to the measurement rail; and a controller.

This application discloses an HDMI interface test fixture, relating to the field of electronic testing equipment technology. The embodiments of this application utilize a male clamp and a female recessed plate to directly connect the HDMI interface and testing instruments. Combined with test points set on the differential and small signal lines, this enables rapid testing of the HDMI interface's signal quality, connectivity, and power capability during signal transmission without disassembling the device casing. It has the advantages of strong compatibility, ease of operation, and low cost. The HDMI interface test fixture disclosed in this application is suitable for the R&D and debugging phases of HDMI interfaces, as well as the troubleshooting phases of HDMI interfaces.

A device for testing optical sensors comprises a drone having an electronic control module for autonomous flight operation, a test object attached to or attachable to the drone, and an electronic test device that is in signal communication with the electronic control module and is configured to (i) at least in a sensor test mode, to bring the drone close to an optical sensor in such a way that the test object enters a detection range of the optical sensor, (ii) to determine an operating state of the optical sensor when the test object is present in the detection area, and (iii) to compare the determined operating state with a target operating state.

The utility model discloses a test signal chip structure convenient to replace, which relates to the technical field of electronic test equipment and comprises a test equipment main body and an embedded groove, the embedded groove is arranged in the test equipment main body, and a fixing piece is fixed on the inner side of the embedded groove. According to the test signal chip structure convenient to replace, the clamping hooks at the bottom corners of the signal chip module are embedded into the embedding grooves formed in the test equipment main body, when the outer surfaces of the clamping hooks make contact with the clamping blocks arranged in the embedding grooves, the clamping blocks rotate along the fixing pieces along with the deepening of the clamping hooks, then the clamping blocks and the grooves in the clamping hooks form clamping connection, and the clamping blocks are clamped into the grooves in the clamping hooks. When the signal chip module needs to be disassembled and replaced, the inclined surface of the clamping block is manually abutted downwards, so that the clamping block rotates downwards, the clamping connection between the clamping block and the clamping hook is removed, the disassembly of the signal chip module is realized, a worker can quickly replace the signal chip module, the operation time is shortened, and the working efficiency is improved. And the test continuity is improved.

The invention relates to the technical field of power electronic test equipment, and discloses a flat conductor single-layer vertically-wound inductor and a manufacturing method thereof, and the flat conductor single-layer vertically-wound inductor comprises an upper magnetic plate, a lower magnetic plate and at least one parallel magnetic core arranged between the upper magnetic plate and the lower magnetic plate, two ends of the parallel magnetic core are respectively and magnetically connected with the upper magnetic plate and the lower magnetic plate to form a closed magnetic circuit, the winding unit is wound on the periphery of the parallel magnetic core, and the winding unit is of a spiral winding structure formed by a continuous flat conductor through multiple times of inward bending. And the flat conductor is wound on the parallel magnetic core in a vertical winding manner. The flat conductor is subjected to continuous inward bending, so that the effects of simplifying the process and improving the performance can be achieved, the winding process is simplified by the single-layer vertical winding structure, accurate inward bending only needs to be performed at a specific position, the method is suitable for automatic production, the production efficiency and consistency are remarkably improved, the cost is reduced, and the performance is effectively improved.

Systems and Methods for capacitance testing of a unit under test with parasitic capacitance directed to a guard rail. The system includes test points, wherein the plurality of test points are divided into at least two groups; a stimulus source; a first group guard relay electrically connected to each of the test points in a first; a second group guard relay electrically connected to each of the test points in a second; a guard rail coupled to the first group guard relay and the second group guard relay; a first group return relay electrically connected to each of the test points in a first group; a second group return relay electrically connected to each of the test points in a second group; a current measurement rail coupled to the first group return relay and the second group return relay; a current meter coupled to the measurement rail; and a controller.

The application provides a system, electronic equipment and storage medium for continuous testing of array devices, comprising a first host computer and a probe station; the first host computer sends a scanning path to the probe station to control the probe station to perform scanning test on a to-be-tested array device; a tray of the probe station moves according to path points set by the scanning path, reaches a specified position, then moves the tray upward to connect a probe and an electrode of the to-be-tested array device, and the to-be-tested array device is tested by an electronic testing device according to a test instruction sent by a second host computer, and the above process is repeated until all electrodes of the to-be-tested array device are tested. Scanning test of any test parameter can be realized on any array device, and then data visualization is performed in combination with a detection position coordinate and a test result of the position, thereby providing comprehensive and effective test data for array devices of different shapes.

The utility model relates to a circuit board assembly test fixture, which comprises a test board, a positioning base, a cover plate assembly and a probe assembly, and is characterized in that the test board comprises a horizontally arranged table board; the positioning base is fixed to the top surface of the table plate; the positioning base is used for fixing a circuit board assembly; the cover plate assembly is fixed to the top face of the table plate. The probe assembly is fixed on the top surface of the table plate; the probe assembly comprises a probe substrate capable of translating in the horizontal direction, and more than two test probes are arranged at one end, facing the positioning base, of the probe substrate; and one end, provided with the test probe, of the probe substrate can be translated into the positioning base. According to the circuit board assembly test fixture provided by the invention, a fixed structure of the test probe is changed into a translation structure, and the test probe is translated into the shell of the circuit board assembly, so that the test contact on the circuit board is in contact with the test probe on the probe substrate, and the circuit board is effectively and electrically connected with electronic test equipment; therefore, the function test of the circuit board is completed.

The application relates to the technical field of electronic test equipment, and discloses a board card testing device which comprises a device base, two groups of testing components for placing detection board cards are arranged on the device base, the testing component comprises a placing plate for placing the board card, a supporting frame is arranged on the device base, a driving device for controlling the up-down lifting of a lower pressing plate in the supporting frame is arranged on the supporting frame, and a control component for controlling the staggered movement of the lower pressing plates of the two testing components is arranged on the supporting frame. Through the cooperative work of the two groups of testing components and the lower pressing plate, the pushing member and the reset member, when a board card on a placing plate is tested, another placing plate can be pushed out for the placing operation of the board card, the synchronization of the testing and placing operations is realized, the testing efficiency is greatly improved, the device is especially suitable for large-scale board card testing scenes, and the time waste caused by waiting for testing in the traditional testing device is avoided.

The utility model relates to a metal plate connecting piece and electronic test equipment. The metal plate connecting piece comprises a plate body, a supporting lug, a first connecting lug, a second connecting lug, a reinforcing rib and an auxiliary supporting lug, the metal plate connecting piece can be fixed on the upper supporting frame through the second connecting lugs and the fasteners, the metal plate connecting piece, the upper supporting frame and the lower supporting frame jointly form a new support structure, the height of the whole support is increased through the metal plate connecting piece, meanwhile, the original structure of the upper supporting frame and the original structure of the lower supporting frame used for installing all electronic elements can be reserved, and therefore the metal plate connecting piece is convenient to use. The requirement for replacing a large screen can be met only by redesigning the sizes of the outer frame, the front panel and the rear panel, and the mounting mode and the mounting position of each electronic component are kept original, so that each module of the equipment does not need to be redebugged for a long time, the original process and production line for mounting each electronic component do not need to be changed, and the production efficiency is improved. And the requirements of customers are met, and the production cycle and the production cost can be ensured not to be greatly influenced to the greatest extent.

The invention aims to provide a multifunctional test module for program verification. The system comprises an MCU unit, the MCU unit is connected with a digital-to-analog converter, a digital multimeter, a pulse signal output and frequency reading unit, a main control chip and flash memory unit, and a pulse width modulation and time division multiplexing unit, the digital-to-analog converter outputs voltage, the voltage is amplified by an operational amplifier circuit and switched by an MUX switch, and the output voltage is converted into the output voltage. The analog-to-digital converter connected to the MCU unit is used for voltage reading, so that control program verification of the digital-to-analog converter and the analog-to-digital converter is realized; the digital multimeter is used for verifying various module programs; the pulse signal output and frequency reading unit outputs PWM signals through the MCU unit, the PWM signals pass through an operational amplifier follower circuit and a comparator, the output signals are connected to the MCU unit to be tested, and the PWM and FREQ program verification function is achieved. The invention is applied to the technical field of electronic test equipment.

A test apparatus is provided.SOLUTION: The slot assembly is removably attached to the frame. Each slot assembly allows for individual heating and thermal control of a respective cartridge inserted into the slot assembly. A closed loop air path is defined by the frame, and the heater and cooler are located in the closed loop air path to heat or cool the cartridge with air. Individual cartridges can be inserted or removed while other cartridges are at various locations to be tested or at various locations of the temperature gradient.SELECTED DRAWING: Figure 1

An electronic test equipment system includes: a user interface; and a dynamically configurable multi-instrument operably coupleable to the user interface. A processor is arranged to apply at least one control signal to a software configurable switch that connects at least one selectable item of test equipment of at least one of: dynamically configurable digital logic circuitry, dynamically configurable analogue circuitry, to at least one individual input-output, IO, of an IO interface that re-configures the dynamically configurable multi-instrument to function as a different measurement or test instrument for a device under test.

This invention discloses an electronic test equipment management system, including an electronic test equipment (1), a test control terminal (2), and a resource management terminal (3). The test control terminal (2) is configured with: a data monitoring module that records "device link records"; and a data monitoring module that records "device access records". The resource management terminal (3) is configured with: an alarm module that issues alarm information after matching "device link records", "device access records" and "predetermined alarm strategies"; and a device status reset module that resets the status of the corresponding electronic test equipment from "in use" to "idle" based on the alarm information. This invention uses the operator's operation on the electronic test equipment as the monitoring object, then analyzes the operation data, and manages the status of the electronic test equipment based on the analysis results.

The application relates to the field of electrical measurement and electronic test equipment, and discloses a charger test method and system. The method comprises the following steps: acquiring a parameter configuration set and a baseline condition, generating a probe and interface configuration structure under the conditions of a four-wire measurement site, protocol abstract card mapping and shunt and Hall channel combination; performing unified time reference binding and event label table initialization, locking a time base by a real-time clock of a microcontroller unit and broadcasting to channels and controllers, executing temperature rise constraint load arrangement and synchronous acquisition, and generating an acquisition preparation package; and executing electrical transient and thermal characteristic extraction and electrical-thermal decoupling fusion, completing consistency determination, threshold comparison and report generation. Through the establishment of a unified time base structure for electrical and thermal dual-domain synchronization, the application realizes multi-channel consistent acquisition and real-time self-diagnosis, improves the precision, traceability and automation level of the charger test process, and is suitable for comprehensive testing and evaluation of multiple types of electronic equipment.

The invention discloses an efficient heat dissipation power grid simulator, and relates to the technical field of power electronic test equipment. The power grid simulator comprises a case, and an input unit, a power conversion unit, a control unit and an auxiliary unit which are arranged in the case. The case is composed of a ventilation baffle, a side baffle, an upper cover plate and a bottom cover plate which are oppositely arranged. A plurality of parallel insulating plates are arranged in the case, and the length direction of the insulating plates is perpendicular to the ventilation baffle, so that the interior of the case is divided into a plurality of independent ventilation areas. Ventilation grid holes communicated with the ventilation area are formed in the ventilation baffle, and a linear airflow channel is formed. A fan of the auxiliary unit is arranged in the channel and drives airflow to flow in a one-way penetrating mode. Air duct construction, electrical isolation and structure supporting are achieved through integration of the insulating plates, the problems of low heat dissipation efficiency, high insulation safety risk, insufficient mechanical stability and inconvenient maintenance are solved by combining the optimized fan array and the bottom suspension gap, the reliability of equipment is remarkably improved, and the service life of the equipment is remarkably prolonged.

The application is suitable for the technical field of electronic test equipment, and provides a super-high-temperature power module test and signal detection device, which comprises a test execution component, a signal acquisition module and a control processing module; the control processing module comprises a tolerance calibration unit configured to extract the basic attenuation characteristics of a signal transmission link under a normal temperature reference, and in combination with an Arrhenius thermal acceleration aging model, extrapolate and calculate the theoretical upper limit of attenuation of the signal transmission link at the target highest working temperature, which is used as a preset physical attenuation tolerance. In the application, the physical attenuation tolerance output by the tolerance calibration unit using the Arrhenius thermal acceleration aging model provides an objective and quantifiable physical reference for the signal quality judgment under high-temperature working conditions, and solves the problem of lack of systematic evaluation of high-temperature link attenuation in the prior art.

This invention aims to provide a testing device and method for testing magnetic displacement curves. The invention includes a frame housing a camera module, a measurement module, and a carrier module. The measurement module includes a moving component, the moving component's actuating end of which is equipped with a pressure sensor. The pressure sensor is connected to a mounting plate, and the mounting plate houses a magnet carrier. The carrier module includes a rotary motor, the top of which is equipped with a mounting base. The mounting base houses a fixed magnet, and the magnet carrier is positioned above the mounting base. The magnet carrier has a mounting groove, and movable magnets are arranged on all four side walls of the mounting groove. The fixed magnet is located inside the mounting groove. The camera module calibrates the position between the movable and fixed magnets, and the pressure sensor detects the force between the movable and fixed magnets. This invention applies to the technical field of electronic testing equipment.

The invention discloses an integrated automatic test method for a vehicle lamp test. The method comprises the following steps: S1, deploying a CAN open enviroent: a Canon test development environment can control a plurality of electronic test devices; s2, a test engineer enters the test system from the test software, if the test item is a new item, a new test script is generated by the Canon test development environment and then the step S3 is executed, and if the test item is an existing item, the step S3 is executed; s3, the Canon tests whether the development environment meets the conditions of the test bench and the test equipment or not, and if yes, the step S4 is executed; and S4, selecting a test bench and test equipment, selecting and executing a test case, and obtaining a test report. According to the integrated automatic test method for the vehicle lamp test, the load of manual test can be reduced, the test efficiency is improved, and the test comprehensiveness is ensured.

The utility model relates to the technical field of electronic test equipment, in particular to a test module pin die structure, which comprises a pin die base and a floating block arranged on the pin die base, a connecting groove is arranged on the floating block, a pin hole is arranged in the connecting groove, a mounting groove corresponding to the pin hole is arranged on the pin die base, and the pin die base is provided with a pin hole. Two needle dies are arranged in the mounting groove and are symmetrically arranged in the mounting groove, and the two ends of each needle die are detachably mounted in the mounting groove through limiting connecting devices; the floating block is in a cross shape, and the floating block is detachably arranged on the needle die base through symmetrical sleeving devices at the four corners. The test module needle die structure is provided with the limiting connecting device, and the needle die arranged in the mounting groove is fixed in the mounting groove and limited; meanwhile, the needle die is further provided with a symmetrical sleeving device, the floating block is stably and conveniently fixed to the needle die base, and it is guaranteed that the needle die is stably connected with the connector arranged in the connecting groove.

Electronic testing device for the automated testing of taximeters, characterized in that • the test device is connected to the device(s) to be tested via a standardized digital interface, • the testing device communicates with the PC via the digital interface, • the test device receives signals or data from the device(s) under test, analyzes them and transmits them in real time to test software, • the testing software performs an evaluation of the received data and creates one or more test reports, • the testing device enables fully automated testing without the need for manual intervention.

The utility model provides a mobile power supply bidirectional inverter test bench, which relates to the technical field of power electronic test equipment and comprises an operation bench, and a positioning mechanism, a clamping mechanism and a test assembly which are arranged on the operation bench. The positioning mechanism comprises a limiting frame arranged on the table top of the operation table, and an anti-static panel is arranged in the limiting frame; the clamping mechanism comprises a fixing frame and a downward pressing mechanism installed on the fixing frame in a sliding mode, the fixing frame comprises a vertically-arranged guide rail, and the downward pressing mechanism is connected with the clamping mechanism in a sliding mode through the guide rail. The testing assembly comprises a contact array located in the limiting frame, a testing circuit, a plurality of buttons and a plurality of indicating lamps, wherein the buttons and the indicating lamps are installed on the operation table. The contact array, the buttons and the indicating lamps are electrically connected through the testing circuit. According to the utility model, rapid positioning and fixing of the circuit board are realized through cooperation of the limiting frame and the pressing mechanism, reliable electrical connection is realized by using the contact array, and the technical defects of low efficiency and poor contact in a traditional manual test are overcome.

This invention discloses a printed circuit board (PCB) testing device and its control method, relating to the field of electronic testing equipment technology. The PCB testing device includes a base, a fixed platform, a test probe assembly, a micro-adjustment structure, and a locking mechanism. The fixed platform is located on the base and has a positioning structure for fixing the PCB to be tested onto it. The test probe assembly is located above the fixed platform and includes a mounting base and multiple probe structures mounted on the mounting base. The probe structures are movably mounted horizontally on the mounting base and contact the pins of the PCB on the fixed platform. The micro-adjustment mechanism is located between the mounting base and the fixed platform, allowing the mounting base to move relative to the fixed platform in the vertical and / or horizontal directions. The locking mechanism can lock the micro-adjustment mechanism, ensuring precise displacement and stable adjusted position, offering advantages such as compact structure and high stability.

The invention discloses a high-precision probe station based on composite driving, relates to the technical field of microelectronic test equipment, and aims to solve the technical problem that displacement driving of an existing probe station cannot give consideration to large-stroke rapid movement and nanoscale positioning precision. The X-axis displacement drive, the Y-axis displacement drive and the Z-axis displacement drive of the probe station all adopt a composite drive framework of coarse-precision drive and high-precision drive, a coarse-precision drive unit adopts a common electromagnetic driver to realize hundred-micron large-stroke rapid movement, and a high-precision drive unit adopts a piezoelectric driver to realize nanoscale high-precision positioning. Through cooperative work of a mechanical coupling structure and a closed-loop control module, organic combination of large-stroke rapid approaching and high-precision positioning is realized. In addition, a magnetorheological fluid active damping system is additionally arranged at the position of the supporting leg and used for balancing the influence caused by vibration of the surrounding environment. The device is compact in structure, rapid in response and high in positioning precision, and can be widely applied to high-precision testing scenes such as semiconductor chip testing and micro-nano device characterization.

The utility model relates to the technical field of electronic test equipment, in particular to a pawl spring probe test seat. According to the technical scheme, the device comprises a base, a pawl spring probe is arranged in the base, the pawl spring probe comprises two sets of mounting plates, a plurality of sets of probe assemblies are arranged above each set of mounting plates, each set of probe assembly comprises a needle tube, a needle body is arranged in each needle tube, a needle head is arranged at the top end of each needle body, and the probe head is arranged on the base. A spring is arranged between the mounting end of the needle body and the inner cavity of the needle tube, a stabilizing plate is arranged above the base, a positioning plate is arranged above the stabilizing plate, and buckle assemblies are arranged on the two sides of the stabilizing plate. According to the utility model, through the mutual cooperation of the pawl spring probe and the positioning plate, the versatility and the utilization rate of the product are greatly improved, through the arrangement of the probe head, the contact area and the contact stability between the product and an element to be detected are greatly increased, the problem of poor contact is effectively avoided, and the accuracy of test data is improved.

A type of tester apparatus is described that tests wafers by contacting terminals on the wafer. A dielectric gas is used to reduce arcing between the contacts. The stationary and portable structures have complementary gas connection portions that engage when the portable structure engages the stationary structure. The gas box has a channeling block connected to a dielectric gas pressure regulator and a nitrogen gas pressure regulator and to gas supply passages to selectively supply nitrogen or dielectric gas to the gas supply passages. The tray is conductive and has a portion that contacts the back wafer terminals and a vacuum passage, each vacuum passage having an enlarged section to reduce arcing.