Test equipment control method, device and system, and electronic equipment

A test equipment and test control technology, applied in the field of testing, can solve the problems of waste of equipment utilization, affecting the testing time of the equipment under test, affecting the testing of the equipment under test, etc., so as to avoid cumbersome operations, improve efficiency, and reduce manual wrong selection of equipment. effect of information

Inactive Publication Date: 2019-04-05
OPPO CHONGQING INTELLIGENT TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] However, the above-mentioned control method of manually selecting the instrument type and configuring the instrument, once the wrong instrument type and instrument control mode are selected due to human factors, because the selected instrument control mode does not match the test instru

Method used

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  • Test equipment control method, device and system, and electronic equipment
  • Test equipment control method, device and system, and electronic equipment
  • Test equipment control method, device and system, and electronic equipment

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Embodiment Construction

[0030] Embodiments of the present application are described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary, and are intended to explain the present application, and should not be construed as limiting the present application.

[0031] The test equipment control method, device, electronic device, and computer-readable storage medium of the embodiments of the present application are described below with reference to the accompanying drawings.

[0032] figure 1 is a flow chart of a testing device control method according to an embodiment of the present application.

[0033] Such as figure 1 As shown, the test equipment control method may include:

[0034] Step 101, establish a communication connection with the test device, and obtain the device inf...

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Abstract

The invention discloses a test equipment control method, device and system, and electronic equipment. The method comprises the following steps: after a connection with test equipment is established, through communication with the test equipment, equipment information of the test equipment is directly obtained from the test equipment; according to the equipment information, a test control strategycorresponding to the test equipment is directly determine; and the test equipment is controlled to test tested equipment according to the test control strategy. Therefore, the tedious operation of manually selecting the equipment information by a user is avoided; the situation that due to manual wrong selection of the equipment information, the test equipment cannot execute instructions in the test control strategy and the test needs to be paused for reselection is reduced; and the test efficiency is improved.

Description

technical field [0001] The present application relates to the technical field of testing, and in particular to a testing equipment control method, device, electronic equipment and computer-readable storage medium. Background technique [0002] In the process of producing electronic equipment, it is necessary to use various instruments to measure and test each functional device in the electronic equipment. Among them, there are differences in the control logic and instructions corresponding to different instruments. In the related technology, generally, the tester on the test station connects the test instrument to the test control equipment, and then the tester manually selects the type of the test instrument in the test control equipment, and manually configures the test control strategy of the test instrument. [0003] However, the above-mentioned control method of manually selecting the instrument type and configuring the instrument, once the wrong instrument type and in...

Claims

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Application Information

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IPC IPC(8): G01R31/00
CPCG01R31/00
Inventor 刘振腾
Owner OPPO CHONGQING INTELLIGENT TECH CO LTD
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