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Electronic equipment and testing method and system of application thereof

A test method and technology of electronic equipment, applied in the field of testing, can solve the problems of compatibility, testing tools cannot be used in different types at the same time, etc.

Inactive Publication Date: 2016-12-21
INVENTEC PUDONG TECH CORPOARTION +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] In view of the shortcomings of the prior art described above, the purpose of the present invention is to provide a testing method and system for electronic equipment and its application, which is used to solve the problem that the same testing tool in the prior art cannot simultaneously operate on different types of operating systems or the same type But compatibility issues in different versions of the operating system

Method used

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  • Electronic equipment and testing method and system of application thereof
  • Electronic equipment and testing method and system of application thereof
  • Electronic equipment and testing method and system of application thereof

Examples

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Embodiment Construction

[0026] Embodiments of the present invention are described below through specific examples, and those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific implementation modes, and various modifications or changes can be made to the details in this specification based on different viewpoints and applications without departing from the spirit of the present invention. It should be noted that, in the case of no conflict, the following embodiments and features in the embodiments can be combined with each other.

[0027] It should be noted that the diagrams provided in the following embodiments are only schematically illustrating the basic ideas of the present invention, and only the components related to the present invention are shown in the diagrams rather than the number, shape and number of componen...

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Abstract

The present invention provides a test method and system for electronic equipment and its application, which are compatible with multiple types of operating systems. The method includes: setting test command sets corresponding to each type of operating system in advance in a test tool, The command set includes test instructions and test programs corresponding to the test instructions; when the test tool is used to test an electronic device, the type of the operating system currently running on the electronic device is read; and the type of operating system currently running on the electronic device is obtained. The test command set; according to the received test command, match the corresponding test program from the obtained test command set to perform the corresponding test operation. For different types of operating systems, the present invention can enable corresponding test command sets to perform corresponding test operations, is compatible with different types of operating systems, and directly tests a variety of different types of operating systems without the need for testing tools. replace.

Description

technical field [0001] The invention relates to the field of testing, in particular to a testing method and system for electronic equipment and its application. Background technique [0002] For different types of operating systems or different versions of the same type of operating system, the system service commands are somewhat different, which will cause the same test tool to be incompatible in different types of operating systems or the same type of operating systems but different versions. Each type of operating system or each version of the same type of operating system needs to replace the corresponding testing tools, which is cumbersome to operate and will reduce testing efficiency. Contents of the invention [0003] In view of the shortcomings of the prior art described above, the purpose of the present invention is to provide a testing method and system for electronic equipment and its application, which is used to solve the problem that the same testing tool in...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
CPCG06F11/3668
Inventor 刘飞
Owner INVENTEC PUDONG TECH CORPOARTION
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