Check patentability & draft patents in minutes with Patsnap Eureka AI!

A synchronous hybrid pressure testing method and system for an AEP memory under Linux

A technology of memory stress testing and stress testing

Active Publication Date: 2019-06-18
SUZHOU LANGCHAO INTELLIGENT TECH CO LTD
View PDF3 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] It can be seen that there is a time difference between the stress test strategy of the existing AEP memory, the stress test of the hard disk module and the stress test of the memory module. It is difficult to control the same, which restricts the reliability of the verification results of AEP memory stability and reliability to a certain extent under the same pressure test

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A synchronous hybrid pressure testing method and system for an AEP memory under Linux
  • A synchronous hybrid pressure testing method and system for an AEP memory under Linux

Examples

Experimental program
Comparison scheme
Effect test

specific Embodiment approach 1

[0041] figure 1 It is a schematic method flow chart of the method for synchronous mixed pressure testing of AEP memory under Linux according to the present invention. in, figure 1 The execution subject may be a synchronous hybrid stress testing system of AEP memory under Linux.

[0042] Such as figure 1 As shown, the synchronous hybrid stress test method 100 of the AEP memory under Linux includes:

[0043] Step 110, build the test environment of AEP memory to be tested under Linux;

[0044] Step 120, configure the mode of the AEP memory to be tested as mix mode;

[0045] Step 130, performing a hardware stress test on the hard disk module of the AEP memory to be tested, and performing a memory stress test on the memory module of the AEP memory to be tested, and the hardware stress test and the memory stress test are performed simultaneously;

[0046] Step 140, recording test results of the hardware stress test and memory stress test.

[0047] Optionally, configuring the mod...

specific Embodiment approach 2

[0082] figure 2 It is a specific implementation of the AEP memory synchronous mixed pressure test system under Linux according to the present invention. The synchronous hybrid stress test system of AEP memory under Linux described in this embodiment corresponds to the synchronous hybrid stress test method of AEP memory under Linux described in Embodiment 1, and is used to test the stability and reliability of AEP memory sex.

[0083] see figure 2 , the synchronous hybrid stress testing system 200 for AEP memory under Linux, comprising:

[0084] Test environment builds unit 210, is used to set up the test environment of AEP memory to be tested under Linux;

[0085] AEP memory mode configuration unit 220, the mode for configuring the AEP memory to be tested is mix mode;

[0086] The AEP memory test unit 230 is used to perform a hardware stress test on the hard disk module of the AEP memory to be tested after the AEP memory mode configuration unit 220 configures the mode of...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a synchronous hybrid pressure testing method and system for an AEP memory under Linux. The synchronous hybrid pressure testing method comprises the steps of building a testing environment of the AEP memory to be tested under Linux; configuring mode of the AEP memory to be tested is configured to be a mix mode; Performing a hardware pressure test on the hard disk module of the AEP memory to be tested, performing a memory pressure test on the memory module of the AEP memory to be tested, and performing the hardware pressure test and the memory pressure test synchronously;And recording test results of the hardware pressure test and the memory pressure test. The method is used for better testing the stability and reliability of the AEP memory.

Description

technical field [0001] The invention relates to the field of memory testing, in particular to a method and system for synchronous mixed pressure testing of AEP memory under Linux. Background technique [0002] AEP (Apache Pass) memory, which adopts 3D XPoint technology, is between hard disk and ordinary memory. It has three modes: memory mode (memory mode), APD mode (hard disk mode) and mix mode (mixed mode). Not only the transmission speed Fast and non-volatile. [0003] When using, you can set the AEP memory mode to any one of the above memory mode, APD mode and mix mode according to actual needs. Among them, when the mode of AEP memory is set to memory mode, AEP memory is similar to ordinary memory and can be used as memory. When the mode of the AEP memory is set to APD mode, the AEP memory can be used as a hard disk, which has the function of storage, but the read and write speed is faster than that of ordinary hard disks. When the AEP memory mode is set to mix mode, ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/26
Inventor 范鹏飞贠雄斌
Owner SUZHOU LANGCHAO INTELLIGENT TECH CO LTD
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com