Supercharge Your Innovation With Domain-Expert AI Agents!

A synchronous hybrid stress testing method and system for aep memory under linux

A technology of memory stress testing and stress testing, which is applied in the detection of faulty computer hardware, functional testing, etc. It can solve problems such as difficult control of the end of stress testing, different start times of stress testing, and constraints on the reliability of AEP. Achieve the effect of reliable design principle, simple structure, good stability and reliability

Active Publication Date: 2022-08-05
SUZHOU METABRAIN INTELLIGENT TECH CO LTD
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] It can be seen that there is a time difference between the stress test strategy of the existing AEP memory, the stress test of the hard disk module and the stress test of the memory module. It is difficult to control the same, which restricts the reliability of the verification results of AEP memory stability and reliability to a certain extent under the same pressure test

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A synchronous hybrid stress testing method and system for aep memory under linux
  • A synchronous hybrid stress testing method and system for aep memory under linux

Examples

Experimental program
Comparison scheme
Effect test

specific Embodiment approach 1

[0041] figure 1 It is a schematic flow chart of the synchronous mixed stress testing method of AEP memory under Linux according to the present invention. in, figure 1 The execution body can be a synchronous hybrid stress testing system of AEP memory under Linux.

[0042] like figure 1 As shown, the synchronous hybrid stress testing method 100 for AEP memory under Linux includes:

[0043] Step 110, build a test environment for the AEP memory to be tested under Linux;

[0044] Step 120, configure the mode of the AEP memory to be tested as mix mode;

[0045] Step 130, performing a hardware stress test on the hard disk module of the AEP memory to be tested, and performing a memory stress test on the memory module of the AEP memory to be tested, the hardware stress test and the memory stress test are performed synchronously;

[0046] Step 140: Record the test results of the hardware stress test and the memory stress test.

[0047] Optionally, the mode for configuring the AEP me...

specific Embodiment approach 2

[0082] figure 2 This is a specific implementation of the synchronous hybrid stress testing system for AEP memory under Linux according to the present invention. The synchronous hybrid stress testing system for AEP memory under Linux described in this embodiment corresponds to the synchronous hybrid stress testing method for AEP memory under Linux described in Embodiment 1, and is used to test the stability and reliability of AEP memory sex.

[0083] see figure 2 , the synchronous hybrid stress testing system 200 of AEP memory under Linux includes:

[0084] The test environment building unit 210 is used to build a test environment for the AEP memory to be tested under Linux;

[0085] The AEP memory mode configuration unit 220 is used to configure the mode of the AEP memory to be tested as mix mode;

[0086] The AEP memory testing unit 230 is configured to perform a hardware stress test on the hard disk module of the AEP memory to be tested, and perform a memory stress tes...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a synchronous mixed stress testing method and system for AEP memory under Linux, including: building a test environment for AEP memory to be tested under Linux; configuring the mode of the AEP memory to be tested as mix mode; The group conducts a hardware stress test, and the memory module of the AEP memory to be tested is subjected to a memory stress test, and the hardware stress test and the memory stress test are performed synchronously; the test results of the hardware stress test and the memory stress test are recorded. The invention is used to better test the stability and reliability of the AEP memory.

Description

technical field [0001] The invention relates to the field of memory testing, in particular to a synchronous mixed stress testing method and system for AEP memory under Linux. Background technique [0002] AEP (Apache Pass) memory, which uses 3D XPoint technology, is between the hard disk and ordinary memory, with three modes: memory mode (memory mode), APD mode (hard disk mode) and mix mode (mixed mode), not only the transmission speed fast and also non-volatile. [0003] When in use, you can set the AEP memory mode to any one of the above memory mode, APD mode and mix mode according to actual needs. Among them, when the mode of AEP memory is set to memory mode, AEP memory is similar to ordinary memory and can be used as memory. When the mode of AEP memory is set to APD mode, AEP memory can be used as a hard disk and has the function of storage, but the read and write speed is faster than that of ordinary hard disks. When the mode of the AEP memory is set to mix mode, the...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/26
Inventor 范鹏飞贠雄斌
Owner SUZHOU METABRAIN INTELLIGENT TECH CO LTD
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com