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High-bandwidth memory test system, test method and test equipment

A high-bandwidth memory, test system technology, used in static memory, instruments, etc.

Active Publication Date: 2021-09-14
YUSUR TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, there is still a lack of effective technical solutions for testing HBM during use

Method used

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  • High-bandwidth memory test system, test method and test equipment
  • High-bandwidth memory test system, test method and test equipment
  • High-bandwidth memory test system, test method and test equipment

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Embodiment Construction

[0049] In order to more clearly understand the above objects, features and advantages of the present disclosure, the solutions of the present disclosure will be further described below. It should be noted that the embodiments of the present disclosure and the features in the embodiments may be combined with each other under the condition of no conflict.

[0050]Many specific details are set forth in the following description to facilitate a full understanding of the present disclosure, but the present disclosure can also be implemented in other ways different from those described herein; obviously, the embodiments in the specification are only a part of the embodiments of the present disclosure, and Not all examples.

[0051] It should be understood that, in the following, "at least one (item)" refers to one or more, and "a plurality" refers to two or more. "And / or" is used to describe the relationship between related objects, indicating that there can be three kinds of relat...

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Abstract

The disclosure relates to a high-bandwidth memory test system, test method and test equipment, wherein the test system includes: a write unit connected to the high-bandwidth memory to be tested; a read unit connected to the high-bandwidth memory; a configuration parameter setting unit to set the high bandwidth Configuration parameters of the memory, sending the configuration parameters to the writing unit and / or the reading unit, so that the writing unit and / or the reading unit starts the test of the high-bandwidth memory based on the configuration parameters; the test parameter processing unit sends the configured test parameters to the writing unit, so that the write unit writes the test parameters into the high-bandwidth memory, and the read unit reads the test parameters from the high-bandwidth memory; the information processing unit is operated to obtain the operation results of the read unit and the write unit, and determine the test index parameters based on the operation results, When the test index parameter reaches the expected index parameter value, output the current test index parameter and the corresponding configuration parameter.

Description

technical field [0001] Embodiments of the present disclosure relate to the technical field of memory testing, and in particular, to a high-bandwidth memory testing system, a high-bandwidth memory testing method, and testing equipment. Background technique [0002] High Bandwidth Memory (HBM) is a high-performance dynamic random access memory (DRAM) based on 3D stack technology, which is suitable for application scenarios with high memory bandwidth requirements, such as graphics processing , network switching and forwarding equipment such as routers, switches, etc. [0003] In the process of using HBM, it is necessary to configure the HBM in the corresponding mode according to the requirements of the application scenario, and then test the operating status data of the HBM in the corresponding mode to obtain some performance index parameters, so as to facilitate feedback and understanding of the characteristics of the HBM. However, there is still a lack of effective technical...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G11C29/56
CPCG11C29/56016
Inventor 鄢贵海卢文岩孔浩
Owner YUSUR TECH CO LTD
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