High-precision detection method and circuit for dynamic response of power supply

A technology of dynamic response and detection method, which is applied in the direction of electronic circuit testing, measuring electronics, measuring devices, etc., can solve problems such as low test efficiency, inability to effectively meet LDO test requirements, and poor reliability, so as to improve efficiency and reliability, and test Process controllable effect

Active Publication Date: 2022-07-29
WUXI ETEK MICROELECTRONICS
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, none of the existing power supplies can effectively meet the test requirements of the dynamic response of the LDO power supply, resulting in problems such as low test efficiency and poor reliability.

Method used

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  • High-precision detection method and circuit for dynamic response of power supply
  • High-precision detection method and circuit for dynamic response of power supply
  • High-precision detection method and circuit for dynamic response of power supply

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Embodiment Construction

[0036] The present invention will be further described below with reference to the specific drawings and embodiments.

[0037] like figure 1 Shown: in order to effectively realize the dynamic response test of the LDO power supply, the test process can be improved, and the efficiency and reliability of the test can be improved. A connected test power supply circuit; the test power supply circuit includes a first high-precision low-temperature drift power supply 2, a second high-precision low-temperature drift power supply 3 and a high-speed power switch S1, and the first high-precision low-temperature drift power supply 2 passes through the high-speed power switch S1 is adapted and connected to the power terminal of the LDO circuit 1 to be tested, the second high-precision low-temperature drift power source 3 is adapted to be connected to the power terminal of the LDO circuit 1 to be tested through the one-way switch 4, and the first high-precision low-temperature drift power s...

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Abstract

The invention relates to a high-precision detection method and circuit for dynamic response of a power supply. It includes an LDO circuit to be tested and a test power supply circuit; the test power supply circuit includes a first high-precision low-temperature drift power supply, a second high-precision low-temperature drift power supply, and a high-speed power switch S1; the high-speed power switch S1 is controlled to be on and off. When the state is cyclically switched, the first test voltage and the second test voltage can be cyclically loaded to the power supply terminal of the LDO circuit to be tested, according to the corresponding working state of the LDO circuit to be tested under the first test voltage and the second test voltage , so as to be able to determine the dynamic response of the power supply of the LDO circuit under test. The invention can effectively realize the power dynamic response test of the LDO, the test process is controllable, and the test efficiency and reliability are improved.

Description

technical field [0001] The invention relates to a test method and circuit, in particular to a high-precision detection method and circuit of dynamic response of a power supply. Background technique [0002] LDO (Linear Voltage Regulator) is the most widely used power management circuit on the market, and one of its core parameters is the dynamic response of the power supply. For the power dynamic response of LDO, it generally needs to be obtained by testing. In the process of testing the power dynamic response of the LDO, a corresponding test voltage needs to be loaded at the power supply end of the LDO, and the dynamic response of the LDO can be measured by using the change of the test voltage. At present, none of the existing power supplies can effectively meet the test requirements of the dynamic response of the LDO power supply, resulting in problems such as low test efficiency and poor reliability. SUMMARY OF THE INVENTION [0003] The purpose of the present inventi...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28
CPCG01R31/282
Inventor 汪芳吴鹤松石波史良俊
Owner WUXI ETEK MICROELECTRONICS
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