High-precision detection method and circuit for dynamic response of power supply

A technology of dynamic response and detection method, which is applied in the direction of electronic circuit testing, measuring electronics, measuring devices, etc., can solve problems such as low test efficiency, inability to effectively meet LDO test requirements, and poor reliability, so as to improve efficiency and reliability, and test Process controllable effect
CN113567840BActive Publication Date: 2022-07-29WUXI ETEK MICROELECTRONICS
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
WUXI ETEK MICROELECTRONICS
Publication Date
2022-07-29

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Abstract

The invention relates to a high-precision detection method and circuit for dynamic response of a power supply. It includes an LDO circuit to be tested and a test power supply circuit; the test power supply circuit includes a first high-precision low-temperature drift power supply, a second high-precision low-temperature drift power supply, and a high-speed power switch S1; the high-speed power switch S1 is controlled to be on and off. When the state is cyclically switched, the first test voltage and the second test voltage can be cyclically loaded to the power supply terminal of the LDO circuit to be tested, according to the corresponding working state of the LDO circuit to be tested under the first test voltage and the second test voltage , so as to be able to determine the dynamic response of the power supply of the LDO circuit under test. The invention can effectively realize the power dynamic response test of the LDO, the test process is controllable, and the test efficiency and reliability are improved.
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Description

technical field

[0001] The invention relates to a test method and circuit, in particular to a high-precision detection method and circuit of dynamic response of a power supply. Background technique

[0002] LDO (Linear Voltage Regulator) is the most widely used power management circuit on the market, and one of its core parameters is the dynamic response of the power supply. For the power dynamic response of LDO, it generally needs to be obtained by testing. In the process of testing the power dynamic response of the LDO, a corresponding test voltage needs to be loaded at the power supply end of the LDO, and the dynamic response of the LDO can be measured by using the change of the test voltage. At present, none of the existing power supplies can effectively meet the test requirements of the dynamic response of the LDO power supply, resulting in problems such as low test efficiency and poor reliability. SUMMARY OF THE INVENTION

[0003] The purpose of the present inventi...

Claims

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