Test fixture and test method suitable for IC bearing disc

A technology for testing fixtures and testing methods, which is applied in the testing of mechanical components, testing of machine/structural components, measuring devices, etc., and can solve problems such as customer complaints, damaged functions of semiconductor packaging products, and contamination of semiconductor packaging products, etc., to achieve The effect of avoiding errors

Pending Publication Date: 2022-02-15
ADVANCED SEMICON ENG INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

When IC carrier trays are used to transport semiconductor package products, the semiconductor package products will be subjected to various external forces during transportation, such as shaking, dropping or temperature difference, which will cause the semiconductor package products and IC carrier trays to collide or squeeze each other. Make the material of the IC carrier plate fall on the semiconductor package product and pollute the semiconductor package product
For example, the formation of particle contamination, which leads to the impairment of the function of semiconductor packaging products
This may lead to customer complaints

Method used

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  • Test fixture and test method suitable for IC bearing disc
  • Test fixture and test method suitable for IC bearing disc
  • Test fixture and test method suitable for IC bearing disc

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Embodiment Construction

[0026] The specific implementation of the present invention will be described below in conjunction with the accompanying drawings and examples. Those skilled in the art can easily understand the technical problems solved by the present invention and the technical effects produced through the contents recorded in this specification. It should be understood that the specific embodiments described here are only used to explain related inventions, rather than to limit the invention. In addition, for the convenience of description, only the parts related to the related invention are shown in the drawings.

[0027] It should be noted that the structures, proportions, sizes, etc. shown in the accompanying drawings of the specification are only used to match the content recorded in the specification for the understanding and reading of those skilled in the art, and are not intended to limit the implementable aspects of the present invention. Limiting conditions, so there is no technic...

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Abstract

The invention relates to a test fixture and a test method suitable for an IC bearing disc. The test fixture suitable for the IC bearing disc comprises a main body which defines a bottom plane, and a groove which is formed in the main body and used for erecting the IC bearing disc. When the IC bearing disc is erected in the groove, the first angle of the IC bearing disc is located on the bottom plane, and a preset angle is formed between the plane where the disc surface of the IC bearing disc is located and the bottom plane.

Description

technical field [0001] The present disclosure relates to the technical field of semiconductors, in particular to a test fixture and a test method suitable for an IC carrier. Background technique [0002] IC (Integrated Circuit) carrier tray (Tray) is a very important carrier container in the back-end process of IC. It is made of polyvinyl chloride (PVC, Polyvinyl Chloride), polyethylene terephthalate (PET, PolyethyleneTerephthalate), polypropylene (PP, Polypropylene) or polystyrene (PS, Polystyrene) and other common plastic materials. IC trays are often used for supporting and packaging electronic parts, information products, and even potted seedlings. Arranged trays. The IC carrier tray has good protection for the supported items. [0003] Since the IC carrier tray is used to completely cover the items that must be protected during transportation, the IC carrier tray must collide with the items. When IC carrier trays are used to transport semiconductor package products, t...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M13/00G01N19/00
CPCG01M13/00G01N19/00
Inventor 陈勇仁廖国成
Owner ADVANCED SEMICON ENG INC
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