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Data acquisition testing device and method thereof

A test device and data acquisition technology, which is applied in the direction of measurement device, frequency measurement device, noise figure or signal-to-noise ratio measurement, etc. problem, to achieve the effect of improving processing and improving accuracy

Pending Publication Date: 2022-05-27
郑文苑
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Problems solved by technology

[0003] For example, the authorized announcement number is CN105515909B, which discloses a data collection and testing method and device, although it realizes that the inspection information corresponding to the verification parameter is extracted from the parameter information, and analyzed to determine whether the uploaded parameter information is intercepted, That is to determine the hijacking verification result, so as to avoid the use of collected data that has been hijacked and improve the accuracy of data collection, but it does not solve the existing data collection test processing, data collection processing and data information testing processing. For the comparison of data information and data information testing, we propose a data acquisition testing device and its method

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  • Data acquisition testing device and method thereof

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Embodiment Construction

[0024] The following will be combined with the accompanying drawings in the embodiments of the present invention, the technical solution in the embodiments of the present invention will be described clearly and completely, it is clear that the embodiments described are only a part of the embodiment of the present invention, not all embodiments. Based on embodiments in the present invention, all other embodiments obtained by those of ordinary skill in the art without making creative work, are within the scope of protection of the present invention.

[0025] See Figure 1 , the present invention provides a technical solution: a data acquisition test apparatus, comprising a test module, the test module is powered on connected to a data processing module, the data processing module is powered on the connection to a data processing module, the data processing module is powered on the data output module, the data output module is powered on the data terminal module, the test module is us...

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Abstract

The invention discloses a data acquisition test device, which comprises a test module, the test module is electrically connected with a data processing module, and the data processing module is electrically connected with a data processing module; one side of the data processing module is electrically connected with a data test module, the data test module is electrically connected with a switch module, the switch module is electrically connected with a test control module, and one side of the data test module is electrically connected with a conversion module; according to the invention, the data information is processed through the data processing module, and the data information is tested through the data testing module after the data information is processed by the data processing module, so that the test content of the data information can be effectively detected, the processing of the data information is improved, and the test efficiency is improved. And the data information and the data test content are compared, so that the accuracy of the data information is improved, and test processing on the data information is completed.

Description

Technical field [0001] The present invention belongs to the field of data acquisition technology, specifically relates to a data acquisition test apparatus and a method thereof. Background [0002] Data acquisition refers to the automatic collection of non-power or power signals from analog and digital units under test such as sensors and other devices to be measured, and sent to the host computer for analysis and processing. The data acquisition system is a combination of measurement software and hardware products based on computers or other special test platforms to achieve a flexible, user-defined measurement system, and the data acquisition needs to be tested and processed after data acquisition, but there are still various problems in the test processing of various data acquisitions on the market. [0003] For example, the authorization announcement number is CN105515909B disclosed a data collection test method and apparatus, although it realizes the verification information...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R19/00G01R23/02G01R25/00G01R29/26
CPCG01R19/0084G01R23/02G01R25/00G01R29/26
Inventor 郑文苑
Owner 郑文苑
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