This invention provides a composition for forming a
photoresist underlayer using a diarylmethane derivative, which can form a film exhibiting high etch resistance, good dry etch
rate ratio and optical constants, good coverage even for so-called uneven substrates, small thickness variation after embedding, and flatness. Furthermore, it provides a method for manufacturing a
polymer suitable for the
photoresist underlayer forming composition, a
photoresist underlayer using the photoresist underlayer forming composition, and a method for manufacturing a
semiconductor device. The photoresist underlayer forming composition comprises an aromatic compound (A) having 6 to 120 carbon atoms, a
reaction product of a compound represented by the following formula (1), and a
solvent. In formula (1), Z represents -(C=O)- or -C(-OH)-, Ar1 and Ar2 each independently represent a substituted phenyl, naphthyl, anthraceneyl, or
pyrene group, and ring Y represents a substituted aliphatic ring, a substituted aromatic ring, or a fused ring of substituted aliphatic and aromatic rings.