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Determination of acceleration parameter range in vacuum fluorescent display device accelerated life test

An accelerated life test and accelerated parameter technology, which is applied in optical instrument testing, machine/structural component testing, instruments, etc., to save life test time and reduce life prediction costs

Inactive Publication Date: 2008-12-24
SHANGHAI UNIVERSITY OF ELECTRIC POWER
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Problems solved by technology

[0005] The present invention aims at the lack of acceleration parameters in the accelerated life test of the vacuum fluorescent display in the existing domestic problems, determines the range of the acceleration parameters in the accelerated life test of the vacuum fluorescent display, and can fill in the blank of the acceleration parameters in the accelerated life test of the domestic vacuum fluorescent display. Therefore, it is possible to estimate the life of VFD in a short time, saving the time of life test and reducing the cost of life prediction

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  • Determination of acceleration parameter range in vacuum fluorescent display device accelerated life test

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Embodiment Construction

[0014] The steps to determine the range of accelerated parameters in the accelerated life test of vacuum fluorescent displays are as follows:

[0015] (1) Select the accelerated stress as the accelerated life test, carry out four sets of constant stress accelerated life tests under the condition that the failure mechanism remains unchanged, and use the Weibull distribution function to describe the life of the VFD;

[0016] Weibull distribution: It is widely used in reliability engineering, especially suitable for the distribution form of cumulative wear failure of electromechanical products. Since it can easily deduce its distribution parameters by using probability paper, it is widely used in data processing of various life tests. The Weibull distribution is obtained based on the weakest link model or series model, which can fully reflect the influence of material defects and stress concentration sources on the fatigue life of materials, and has an increasing failure rate, so...

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Abstract

The invention relates to the determination of acceleration parameter range in the acceleration service life test of vacuum fluorescent displays (VFD) and discloses a method that comprises the following steps: (1) the service life of the VFD is described by applying the Weibell distribution function; (2) a shape parameter m and a size parameter Eta of the Weibell distribution are estimated by adopting the maximum likelihood method; (3) the range of an acceleration parameter Beta in the acceleration service life test of the vacuum fluorescent display is calculated by combining Arrhenius equation and the least square method. The method calculates the range of the acceleration parameter Beta in the acceleration service life test of the vacuum fluorescent display based on the maximum likelihood method, thus estimating the service life of the VFD in a short time, saving time for the service life test and lowering service life prediction cost.

Description

technical field [0001] The invention relates to an accelerated life test method of a vacuum fluorescent display, in particular to the determination of the accelerated parameter range in the accelerated life test of a vacuum fluorescent display. Background technique [0002] In recent years, VFDs, which use fluorescent display elements to form visible alphanumeric or graphic images, have been widely used in the display of electronic and electrical equipment. [0003] In order to survive and develop in the increasingly fierce market competition, the reliability of the product is particularly important, and the accelerated life test makes it possible to estimate the life information of the product in a relatively short period of time. [0004] The Chinese national standard GB9586-1988, titled "Accelerated Life Test Method for Fluorescent Digital Tubes", discloses the acceleration parameters of fluorescent digital display tubes (fluorescent tubes) as "24300 for multi-position tu...

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Application Information

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IPC IPC(8): G01M11/00
Inventor 张建平
Owner SHANGHAI UNIVERSITY OF ELECTRIC POWER
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