The invention provides a leaf spring normal-temperature and high-temperature stress relaxation life predicting method. Firstly, a spring sample to be tested is prepared, and the prepared spring sample to be tested is an equal stress sample; then a test device is arranged, side plates are fixed at the front part and the rear part of a base of the test device, two ends of the sample are respectively arranged on the side plates, the base and an upper plate are fixed together through limiters, a pressure sensor is arranged on the upper plate, and a pressure head arranged at the lower end of the pressure sensor applies pressure on the sample; and then a spring stress relaxation experiment is carried out, stress values at different time are acquired to determine the stress relaxation loss condition of a sample material after the regulated experiment time is up, test data is selected according to failure criteria, the data is processed by an empirical formula and an Arrhenius equation, and finally the life of the sample at the normal temperature is determined. According to the method disclosed by the invention, sample bending deflection which is not easy to measure is converted into an electrical signal which is easy to measure, the work efficiency is improved, the method is simple, and the obtained life prediction result is accurate.