A method for predicting that storage life of a data product
A technology of data products and storage life, which is applied in the direction of electrical digital data processing, special data processing applications, instruments, etc., and can solve problems such as inappropriateness and prediction result errors
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[0083] In addition to the embodiments described below, the invention can be embodied in other embodiments or carried out in different ways. It is, therefore, to be understood that the invention is not limited to the details of construction of the components described in the following description or shown in the drawings.
[0084] Below in conjunction with the accelerated performance degradation test and the storage life prediction example of conductive film resistance, the present invention is described in further detail, as figure 1 as shown,
[0085] Step 1. Carry out accelerated performance degradation test based on temperature stress
[0086] 21 conductive film resistor samples were put into the accelerated performance degradation test. The test was carried out by applying constant temperature stress. Four different stress levels were taken, namely 60°C, 85°C, 110°C and 140°C. Arrangements were made at the 60°C stress level 8 test samples, 5 test samples at 85°C stress l...
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