Leaf spring normal-temperature and high-temperature stress relaxation life predicting method

A stress relaxation and leaf spring technology, applied in the field of leaf spring life prediction, can solve the problems of long test time, low degree of automation, and poor life prediction accuracy, so as to achieve accurate life prediction results, improve work efficiency, and ensure accuracy Effect

Inactive Publication Date: 2012-08-29
BEIHANG UNIV
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Problems solved by technology

[0004] The present invention provides a leaf spring in order to solve the problems in the prior art that the automation degree of leaf spring life prediction is low, the test time is long, the err

Method used

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  • Leaf spring normal-temperature and high-temperature stress relaxation life predicting method
  • Leaf spring normal-temperature and high-temperature stress relaxation life predicting method
  • Leaf spring normal-temperature and high-temperature stress relaxation life predicting method

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Embodiment Construction

[0040] The present invention will be described in detail below in conjunction with the accompanying drawings.

[0041] The test mode provided by the present invention is based on the following test equipment, such as figure 1 with image 3 As shown, the test equipment mainly includes the following modules: a base 1 , a limiter 2 , an upper plate 3 , a pressure sensor 4 , an indenter 5 , a front side plate 6 and a rear side plate 7 .

[0042] Such as figure 1 with 2As shown, the upper board 3 is placed directly above the base 1 , and the base 1 corresponds to the center of the upper board 3 . The base 1 and the upper plate 3 are fixed together by two limiters 2 on the left and right. A pressure sensor 4 is fixed at the center of one side of the upper plate 3 opposite to the base 1 , and an indenter 5 is fixed at the other end of the pressure sensor 4 . The pressure sensor 4 is connected to the external data display instrument through the sensor lead 8, and transmits the me...

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Abstract

The invention provides a leaf spring normal-temperature and high-temperature stress relaxation life predicting method. Firstly, a spring sample to be tested is prepared, and the prepared spring sample to be tested is an equal stress sample; then a test device is arranged, side plates are fixed at the front part and the rear part of a base of the test device, two ends of the sample are respectively arranged on the side plates, the base and an upper plate are fixed together through limiters, a pressure sensor is arranged on the upper plate, and a pressure head arranged at the lower end of the pressure sensor applies pressure on the sample; and then a spring stress relaxation experiment is carried out, stress values at different time are acquired to determine the stress relaxation loss condition of a sample material after the regulated experiment time is up, test data is selected according to failure criteria, the data is processed by an empirical formula and an Arrhenius equation, and finally the life of the sample at the normal temperature is determined. According to the method disclosed by the invention, sample bending deflection which is not easy to measure is converted into an electrical signal which is easy to measure, the work efficiency is improved, the method is simple, and the obtained life prediction result is accurate.

Description

technical field [0001] The invention belongs to the technical field of leaf spring life prediction, and in particular relates to a method for predicting the stress relaxation life of a leaf spring at room temperature and high temperature. Background technique [0002] Beryllium bronze is widely used in electronic components such as relays, contactors and electrical connectors due to its excellent mechanical properties, wear resistance and fatigue resistance, electrical conductivity and elasticity. As an elastic alloy, stress relaxation is its main failure mode in long-term storage and use. In order to make leaf springs (mostly beryllium bronze) used reliably in various electromechanical components, it is necessary to rationalize their service life. predict. At present, there is no uniform standard for stress relaxation tests in different countries, and the test devices are also different, so the life prediction methods are also different. [0003] The cantilever beam test ...

Claims

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Application Information

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IPC IPC(8): G01N3/40G01N3/54
Inventor 赵世君张卫方赵丽杨明远王爽陈宇
Owner BEIHANG UNIV
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