The invention discloses a method for measuring the integral light decay property of an LED (light emitting diode) lamp. The method comprises the following steps: firstly, selecting an LED lamp bead in the LED lamp as a to-be-tested device, secondly, putting the LED lamp into an incubator, disconnecting a circuit line between a driving power output and an LED array, connecting an ammeter in the circuit in series, and connecting a voltmeter to two sides of the to-be-tested device, thirdly, stabilizing the testing temperature in the incubator, taking the testing temperature as initial temperature T1, fourthly, turning on the LED lamp, and recording working voltage V1 and series current I1, fifthly, recording working voltage V2 and series current I2 at a stable thermal equilibrium state, sixthly, obtaining forward voltage difference Delta Vf, which is equal to V2 minus V1, seventhly, obtaining junction temperature difference Delta t, which is equal to Delta Vf/K, eighthly, obtaining junction temperature value T2, which is equal to T1 plus Delta t, and ninthly, looking up the light decay curve of an LED device, taking a cross axis reading in a position where a corresponding T2 decline curve and 70 percent of a normal axis are intersected as the service life of LED and also as the service life of the LED lamp at 70 percent of light decay.