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Method for LED aging accelerating

An accelerated aging, LED chip technology, applied in the direction of lamp testing, etc., can solve problems such as defects

Inactive Publication Date: 2015-07-08
TIANJIN POLYTECHNIC UNIV
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Problems solved by technology

[0005] Researchers noticed the effect of radiation on the properties of semiconductor materials as early as around 1950, but at that time people only used radiation as an effective means to study point defects

Method used

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  • Method for LED aging accelerating

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Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0017] 1. In the experiment, the AlGaInP-based LED chips were irradiated with electron beams. A GJ-15 Dynamitron series particle accelerator with an energy of 1.5 MeV and a series of supporting beam transmission devices are used for the irradiation. The process of electron beam irradiation LED chip is to use electron beam to irradiate the sample on the conveyor belt. Irradiation is carried out in a standard atmospheric pressure, room temperature conditions, and ordinary air atmosphere, which are experimental conditions set as far as possible with reference to the working environment of LEDs. The beam current and energy of the electron beam are controlled by the electron accelerator, while the dose and flux of the sample to be irradiated are determined by the speed of the conveyor belt and the irradiation time. Adjust the speed of the conveyor belt and the irradiation time to adjust the dose of irradiation received. A dose value of 5KGy is selected here. It is also possible ...

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Abstract

Provided is a method for LED aging accelerating. Electron beam irradiation equipment is used for carrying out irradiation on an LED chip, irradiation energy, dose and time are adjusted, and aging accelerating is carried out on an LED. The method comprises the steps that first, the LED chip is subjected to electron beam irradiation, a particle accelerator and a series of matched beam transmission devices are used for irradiation, the speed of a conveying belt and irradiation time are adjusted, and the irradiation dose is adjusted; then, the LED chip obtained after irradiation works under certain working current, and lighting effect testing is carried out with an integrating sphere at intervals; then, an LED light effect decay curve obtained after electron beam irradiation is subjected to fitting, and a corresponding function curve is obtained; and finally an electron beam irradiation LED aging accelerating light effect decay empirical formula is obtained, and the LED chip is subjected to service life estimation. The invention aims at providing the experimental method for LED aging accelerating, through the electron irradiation method and the obtained empirical formula, the working time for an LED aging test can be saved, and good practical value is achieved in the field of LED chip production and application.

Description

technical field [0001] The invention relates to a method for accelerating the aging of a light emitting diode (Light Emitting Diode, LED) by using irradiation technology. The present invention uses electron beams produced by Dynamitron (ground nanometer) series accelerators to irradiate LEDs, and uses DJ5000 LED aging tester (high-power type) to carry out aging experiments. After a long period of comparison, it is obtained that electron beam irradiation has a certain acceleration on LEDs. Aging effect. It belongs to the field of semiconductor devices. Background technique [0002] LED is called the fourth-generation green lighting source, which is a semiconductor solid device that directly converts electrical energy into light energy. Because LED has the advantages of energy saving, high efficiency, environmental protection, and long life, in addition to the LED light source that is being popularized in the field of daily electric lighting, there are currently two main typ...

Claims

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Application Information

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IPC IPC(8): G01R31/44
Inventor 于莉媛牛萍娟刘超田海涛杨广华张建新宁平凡
Owner TIANJIN POLYTECHNIC UNIV
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