Maintenance-free high-temperature gas sampling probe
A high-temperature gas, sampling probe technology, applied in the direction of sampling devices, etc., can solve the problems of gas port blockage, inability to effectively remove the crust at the sampling port, analysis distortion, etc., to achieve the effect of improving accuracy, realizing maintenance-free use, and avoiding sampling interruption.
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[0023] Preferred embodiments of the present invention will be described in detail below. It should be understood that the preferred embodiments are only for illustrating the present invention, but not for limiting the protection scope of the present invention.
[0024] see figure 1 , a maintenance-free high-temperature gas sampling probe, consisting of a jacketed cooling shell tube 21, a bumper assembly 22, a sample gas sampling tube, and a bumper drive assembly 23;
[0025] see figure 2 The jacketed cooling shell pipe 21 includes a jacketed cooling pipe 2 including an inner cylinder 24 and a cooling layer 25 at least partially covering the outside of the inner cylinder 24. One end of the jacketed cooling pipe 2 is a pipe head 1, and the pipe is The middle part of the head 1 has a sampling port connected to the inner cylinder 24, the other end of the jacketed cooling pipe 2 is provided with a collision head assembly connecting flange 5, and the cooling layer 25 is provided ...
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