Novel ion source for time-of-flight mass spectrometer
A technology of time-of-flight mass spectrometry and ion source, applied in the field of instrumentation, can solve the problems of difficult disassembly and cleaning, complicated structure of the external ion source, etc., and achieve the effects of simple structure, improved ionization efficiency, and improved collision efficiency.
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[0009] attached figure 1 And attached figure 2 It is a schematic diagram of an external ion source for a time-of-flight mass spectrometer realized according to the invention. The gas sample inlet (1) (2) (3), the ionization chamber (4), the filament and the filament generate a narrow electron beam Slit (5), repulsion accelerating electrode (6), permanent magnet pole (7), extraction slit (8), external ion source heating rod (9), external ion source temperature probe (10), external ion source fixing rod (11)(12)(13)(14) composition. Starting from the gas sample inlet (1) and centered on the repulsion accelerating electrode (6), on the ionization chamber (4), arranged clockwise, the external ion source fixing rod (11), filament and Filament produces electron beam slit (5), external ion source fixing rod (12), external ion source heating rod (9), gas sampling port (2), gas sampling port (3), external ion source temperature probe ( 10), external ion source fixing rod (13), perm...
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