Method for simulating wide-band electromagnetic scattering property of conductor target

A technology of electromagnetic scattering characteristics and simulation methods, applied in electrical digital data processing, special data processing applications, instruments, etc., can solve problems such as inability to understand the interaction of fields, loss of advantages of frequency domain methods, and huge computational complexity, saving energy. The effect of unknown quantity, good adaptability and accurate calculation results

Active Publication Date: 2013-09-04
NANJING UNIV OF SCI & TECH
View PDF2 Cites 29 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The above-mentioned documents 1 to 3 report the analysis method using the phase basis function in the frequency domain. However, due to the resonance phenomenon and the existence of high and low frequency components, the calculation methods at

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for simulating wide-band electromagnetic scattering property of conductor target
  • Method for simulating wide-band electromagnetic scattering property of conductor target
  • Method for simulating wide-band electromagnetic scattering property of conductor target

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0020] The present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0021] The present invention is a time-domain electric field integral equation method based on the time-lag basis function. First, a time-lag basis function is designed according to the time-lag amount of the incident electromagnetic wave, and then the space basis function is combined with the time-delay basis function to approximate the induction of the expanded time domain. current, and substitute the current approximate expansion expression into the electric field integral equation in the time domain, and conduct the point test in time and the Galerkin test in space respectively for the discrete integral equation to form a matrix equation, and adopt the generalized minimum margin method The time-stepping algorithm solves the system matrix equation to obtain the induced current distribution at each moment, and finally calculates the ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a method for simulating the wide-band electromagnetic scattering property of a conductor target. The method comprises the following steps that the geometric model of the conductor target is built, and mesh generation is conducted on the surface of the conductor target by a curved surface triangle unit; a time domain electric field integral equation of the conductor target is determined; a surface induction current in the time domain electric field integral equation expands through a space CRWG primary function and a time delay primary function; an expanding surface induction current expression is substituted into the time domain electric field integral equation, and then the time domain electric field integral equation in a discrete form is tested in a time and space mode so as to obtain a system impedance matrix equation; singularity integrals are eliminated to obtain a sparse expression of a impedance matrix; the equation of the impedance matrix is solved to determine the distribution of the time domain current of the surface of the conductor target, and wide-band electromagnetic property parameters of the target are obtained according to the distribution of the time domain current so as to finish simulation. The method for simulating the wide-band electromagnetic scattering property of the conductor target has the advantages of being high in simulation precision, little in required time and low in memory consumption, and has wide application prospect.

Description

technical field [0001] The invention relates to the technical field of electromagnetic simulation, in particular to a simulation method for broadband electromagnetic scattering characteristics of a conductor target. Background technique [0002] In recent years, with the rapid development of science and technology, the demand for simulating ultra-wideband signals and nonlinear systems is increasing. Therefore, there is an urgent requirement for fast, accurate and stable simulation and analysis of transient electromagnetic problems in arbitrary complex conductor dielectric structures. In actual engineering, to obtain a broadband response, the frequency domain method can be used to calculate enough frequency points, and then the target broadband response data can be obtained through Fourier inverse transform. [0003] In the frequency domain integral equation method analysis, the induced current on the target surface is a complex vector, that is, the induced current contains b...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G06F17/50
Inventor 陈如山丁大志樊振宏查丽萍
Owner NANJING UNIV OF SCI & TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products