Eureka AIR delivers breakthrough ideas for toughest innovation challenges, trusted by R&D personnel around the world.

Resistor testing apparatus

A technology of resistance test and resistance meter, which is applied in the direction of measuring device, measuring resistance/reactance/impedance, measuring electrical variables, etc., can solve the problems of no secondary test, narrow space, easy oxidation of conductive silver paste, etc., to avoid inaccurate Control, improve measurement accuracy, ingenious structure and effect

Inactive Publication Date: 2014-03-26
CHENGDU JINCAI TECH +1
View PDF9 Cites 12 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] 2) The test must be carried out in a corundum tube in a tube furnace with an inner diameter of only about 35mm, and the space is narrow, which makes it difficult to design and manufacture the test device;
[0005] 3) The temperature instrument of the tube furnace itself cannot accurately reflect the temperature of the sample, and a temperature measuring device that can accurately reflect the temperature of the sample must be provided
The disadvantage of this method is that: on the one hand, the conductive silver paste is easy to oxidize at high temperature, resulting in poor contact between the probe and the sample and some interface problems, and the silver paste is easy to diffuse with the sample under high temperature conditions, pollute the sample, and cannot be tested again ; On the other hand, the method of silver paste welding determines that the distance between the four probes cannot be accurately controlled, and each sample must be welded, the measurement error increases and the test is complicated. Therefore, this method tests the effect at high temperature Not so good
[0007] In the current test method, a thermocouple is usually placed next to the sample to be tested to measure the test temperature, or the temperature value of the tube furnace is directly recorded as the temperature value of the sample to be tested. These methods cannot achieve Accurate measurement of the temperature of the sample to be tested

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Resistor testing apparatus
  • Resistor testing apparatus
  • Resistor testing apparatus

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0038] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0039] Such as figure 1As shown, the four-probe resistance testing device in this embodiment includes a tube clamp 1, a resistance measuring probe assembly 2 and a sample stage assembly 3, and the resistance measuring probe assembly 2 and the sample stage assembly 3 are movably connected through the tube clamp 1 together;

[0040] The resistance probe assembly 2 includes a horizontal ceramic tube 21, a vertical ceramic tube 22, a fastener 23 and a nickel wire 24, and the vertical ceramic tube 22 is fixedly connected to one end of the horizontal ceramic tube 21 through the nickel wire 24 and the fa...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a resistor testing apparatus. The apparatus comprises a four-point resistor testing device, a resistance meter, a thermometer, a tubular furnace, a gas cylinder, an air exhauster, an air inlet flange and an air exhaust flange, wherein the four-point resistor testing device comprises a resistance testing probe assembly and a sample bench assembly which are movably connected through a tubular clamp; the resistance testing probe assembly is provided with resistance testing probes; the sample bench assembly is provided with a sample bench and a temperature measuring probe; and the resistance testing probes abut tight against the upper surface of the sample bench under effects of the bite force of the tubular clamp. The use of the four-point resistor testing device improves the accuracy of the resistor testing apparatus provided by the invention, at the same time, during measurement of a sample to tested, on one hand, the sample to be detected is not polluted, and on the other hand, the problem of incapability of accurate control of the positions of the four probes due to silver slurry pasting in a conventional testing method can be solved. Besides, the measuring temperature is not restricted by an oxidation temperature of silver slurry anymore, and theoretically, the testing temperature can reach the melting point of a platinum wire, i.e., 1680 DEG.

Description

technical field [0001] The invention belongs to the technical field of material testing, and in particular relates to a resistance testing device. Background technique [0002] It is a difficult point to accurately, conveniently, quickly and intelligently test the resistance value of materials that change with temperature changes in a large temperature range. The difficulty lies in: [0003] 1) To accurately test the resistance of the material, it is best to use the standard four-probe form. The material used for the four-probe at high temperature is very demanding, and it is resistant to high temperature and oxidation; [0004] 2) The test must be carried out in a corundum tube in a tube furnace with an inner diameter of only about 35mm, and the space is narrow, which makes it difficult to design and manufacture the test device; [0005] 3) The temperature instrument of the tube furnace itself cannot accurately reflect the temperature of the sample, and a temperature measu...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01R27/02
Inventor 洪敦华
Owner CHENGDU JINCAI TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Eureka Blog
Learn More
PatSnap group products