Experiment power supply and experiment system

A technology of test power supply and source, which is applied in the electrical field, can solve the problems of poor waveform quality of the test power supply, achieve the effects of reducing electromagnetic interference, reducing switching loss, and improving the quality of waveform output

Inactive Publication Date: 2014-06-18
湖南银河电气有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The main purpose of the present invention is to provide a test power supply and a test system to solve the problem of poor waveform quality of the test power supply in the prior art

Method used

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  • Experiment power supply and experiment system
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  • Experiment power supply and experiment system

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Embodiment Construction

[0020] In order to enable those skilled in the art to better understand the solutions of the present invention, the following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only It is an embodiment of a part of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.

[0021] It should be noted that the terms "first" and "second" in the description and claims of the present invention and the above drawings are used to distinguish similar objects, but not necessarily used to describe a specific sequence or sequence. It is to be understood that the data so used are interchangeable under appropriate ...

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PUM

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Abstract

The invention discloses an experiment power supply and an experiment system. The experiment power supply comprises a transformer, a rectifier connected with the transformer, a three-phase inverter connected with the rectifier. An A phase inverter, a B phase inverter and a C phase inverter in the three-phase inverter are the same in structure. The A phase inverter comprises a first inversion unit and a controller, wherein the first inversion unit comprises n first switch elements which are connected in series, n is larger than or equal to four, and the controller is connected with all the first switch elements and is used for controlling the switch states of all the first switch elements. The experiment power supply and the experiment system solve the problem that the waveform quality of an experiment power supply in the prior art is poor, so that the effects of reducing the harmonic content in output voltage of the experiment power supply and improving the output quality of waveforms of the experiment power supply are further achieved.

Description

technical field [0001] The invention relates to the electrical field, in particular to a test power supply and a test system. Background technique [0002] figure 1 It is the basic schematic diagram of the test power supply in the prior art, such as figure 1 As shown, the output potential of the test power supply in the prior art has only two values, and it is a two-level power supply. In this two-level power supply, not only the voltage borne by each switching device is relatively high, but also The effect of switching frequency (generally dozens of KHZ) will produce high switching loss and electromagnetic interference (EMI for short). The electromagnetic interference plus the voltage on the switching device will make the output of the test power supply The waveform quality deteriorates and contains a large number of harmonics. Moreover, this kind of test power supply usually uses multiple technologies to increase the voltage level of the inverter or converts the voltage...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H02M5/458H02M1/12
Inventor 鄢文
Owner 湖南银河电气有限公司
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