Device for generating double-uniformity-area magnetic field and correction method for magnetometer correction

A technology for generating devices and magnetometers, applied to measuring devices, instruments, measuring electrical variables, etc., can solve problems such as probe positioning errors

Inactive Publication Date: 2014-06-25
710TH RES INST OF CHINA SHIPBUILDING IND CORP
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  • Abstract
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Problems solved by technology

[0004] In view of this, the present invention provides a dual-uniform-region type magnetic field generating device and a calibration method for magnetometer calibration, which solves the problem of probe positioning errors and position micro-changes affecting calibration gradients in the calibration process of traditional gradient magnetic field devices. Influenced by the calibration results of the magnetometer, it can generate a magnetic field output with any gradient, and is simple to manufacture, and can provide a large gradient measurement distance

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  • Device for generating double-uniformity-area magnetic field and correction method for magnetometer correction
  • Device for generating double-uniformity-area magnetic field and correction method for magnetometer correction
  • Device for generating double-uniformity-area magnetic field and correction method for magnetometer correction

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[0022] The present invention will be described in detail below in conjunction with the accompanying drawings.

[0023] The invention provides a double-uniform-region type magnetic field generating device for gradient magnetometer calibration, which includes two parts: a sliding gradient magnetic field coil device and a gradient magnetic field excitation device. The sliding gradient magnetic field coil device includes a uniform-intensity spiral Tube 1, torque-free solenoid 2, slide 3 and base 4; as figure 1 shown. The uniform solenoid 1 is fixed on the base 4, and there is a rack channel inside the base 4. The sliding table 3 is divided into upper and lower layers. The torque-free solenoid 2 is fixed on the upper layer of the sliding table, and the lower layer of the sliding table is connected to the rack channel Cooperate, the axis of the torque-free solenoid 2 coincides with the uniform solenoid 1, and the torque-free solenoid 2 is composed of two coaxial solenoids inside an...

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Abstract

The invention discloses a device for generating a double-uniformity-area magnetic field and a correction method for magnetometer correction. The device comprises a sliding gradient magnetic field coil device and a gradient magnetic field excitation device, wherein the sliding gradient magnetic field coil device comprises a uniform solenoid, a torque-free solenoid, a sliding table and a base. The gradient magnetic field excitation device comprises a dual-output direct-current current source and two ampere meters, and can generate two uniform magnetic fields meeting gradient test requirements. The problem that positioning errors and position slight changes of a probe influence the correction result of gradient magnetometer correction when a traditional gradient magnetic field device is used in the correction process is solved. Magnetic output at any gradient can be generated, manufacturing is simple, and large-gradient distance measuring can be achieved.

Description

technical field [0001] The invention relates to the field of magnetometer calibration, in particular to a double-uniform zone type magnetic field generating device and a calibration method for magnetometer calibration. Background technique [0002] At present, gradient magnetometers are calibrated by gradient magnetic field devices. Traditional gradient magnetic field devices generally use Helmholtz gradient magnetic field coils with opposite winding directions as magnetic field generators. The magnetic field generated by this device is a linear and continuous gradient magnetic field. When calibrating the magnetic induction intensity of a gradient magnetometer with high resolution, since the traditional gradient magnetic field device generates a linear and continuous gradient magnetic field, during calibration, the positioning error of the magnetic probe position and the slight change in the position of the magnetic probe during the calibration process will cause serious prob...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R35/00
Inventor 周鹰宋新昌杨云
Owner 710TH RES INST OF CHINA SHIPBUILDING IND CORP
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