Device for generating double-uniformity-area magnetic field and correction method for magnetometer correction
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- 710TH RES INST OF CHINA SHIPBUILDING IND CORP
- Publication Date
- 2014-06-25
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The invention relates to the field of magnetometer calibration, in particular to a double-uniform zone type magnetic field generating device and a calibration method for magnetometer calibration. Background technique
[0002] At present, gradient magnetometers are calibrated by gradient magnetic field devices. Traditional gradient magnetic field devices generally use Helmholtz gradient magnetic field coils with opposite winding directions as magnetic field generators. The magnetic field generated by this device is a linear and continuous gradient magnetic field. When calibrating the magnetic induction intensity of a gradient magnetometer with high resolution, since the traditional gradient magnetic field device generates a linear and continuous gradient magnetic field, during calibration, the positioning error of the magnetic probe position and the slight change in the position of the magnetic probe during the calibration process will cause serious prob...