Test data automatic generation device and test data automatic generation method

A technology for testing data and data, applied in the field of data processing, which can solve problems such as test data not meeting business meaning, incomplete test path coverage, and missing test points.

Active Publication Date: 2014-09-24
INDUSTRIAL AND COMMERCIAL BANK OF CHINA
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  • Summary
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  • Application Information

AI Technical Summary

Problems solved by technology

[0008] In order to overcome the problems of omission of test points, incomplete test path coverage, test data not conforming to the business meaning and a large number of repeated manual operation

Method used

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  • Test data automatic generation device and test data automatic generation method
  • Test data automatic generation device and test data automatic generation method
  • Test data automatic generation device and test data automatic generation method

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Embodiment

[0117] Such as image 3 Shown is a structural diagram of a device for automatically generating test data provided in this embodiment. The device is composed of a data storage unit 1 , a sample data extraction unit 2 , a data analysis unit 3 , a test path generation unit 4 , a data path generation unit 5 and a test data generation unit 6 .

[0118] The data storage unit 1 is responsible for storing and storing the basic metadata information, metadata relationship, metadata dictionary values ​​and statistical rules, statistical objects and other test objects needed in the process of generating test data, as well as the data obtained from the sample data extraction unit 2. Sample data and basic table data generated by the test data generating unit 6 .

[0119] The sample data extraction unit 2 is responsible for establishing a business model according to the metadata relationship in the data storage unit 1, and extracting production data according to the business model, and stor...

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Abstract

The invention provides a test data automatic generation device and a test data automatic generation method. The test data automatic generation device comprises a data storage unit, a sample data extraction unit, a data analysis unit, a test path generation unit, a data path generation unit and a test data generation unit, wherein the data storage unit stores a test object, metadata relation information and metadata dictionary value; the sample data extraction unit obtains sample data according to the metadata relation information; the data analysis unit performs hierarchical analysis on the test object according to the metadata dictionary value to obtain the Boolean matrix and the Boolean list; according to the pruning strategy, the test path generation unit treats the redundant parts and the conflict parts of the Boolean matrix and the Boolean list to obtain nodes of a test path, as well as the valid data range and the invalid data range of the Boolean list; according to the test object and the metadata relation information, the data path generation unit obtains nodes of a data path and generates node data of the data path by utilizing the nodes of the data path, the sample data, as well as the valid data range and the invalid data range of the Boolean list; the test data generation unit completes automatic generation of the test data according to the node data of the data path.

Description

technical field [0001] The invention relates to the field of data processing, in particular to a device and method for automatically generating test data. Background technique [0002] With the advent of the era of big data, businesses rely more and more on technology, and at the same time put forward higher requirements for software quality and R&D cycle. As the guardian of product quality, software testing urgently needs to find a A new idea and a new method to deal with the problems of software quality and testing efficiency under large-scale R&D. [0003] In the past, a project was jointly tested by multiple testers, with sufficient test time and sufficient human resources. Manual design of test paths, manual design of test data, and manual verification of test results can basically guarantee test quality. Today, simple manual operations can no longer meet the requirements for software quality under high-efficiency and high-intensity research and development. The main p...

Claims

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Application Information

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IPC IPC(8): G06F11/36
Inventor 王玮赵靓
Owner INDUSTRIAL AND COMMERCIAL BANK OF CHINA
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