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Dielectric property testing method for dielectric materials

A technology of dielectric properties and dielectric materials, which is applied in the field of dielectric property testing of high-frequency printed board substrates, and can solve the problems that the test method is not suitable for high-frequency printed substrates.

Inactive Publication Date: 2015-04-29
JIANGNAN INST OF COMPUTING TECH
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Problems solved by technology

[0004] Although the research on dielectric property test methods has been reported in the literature since the middle of last century, with the continuous increase of test frequency and the continuous development of materials, many test methods are not suitable for high-frequency printed substrates

Method used

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  • Dielectric property testing method for dielectric materials
  • Dielectric property testing method for dielectric materials
  • Dielectric property testing method for dielectric materials

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Embodiment Construction

[0027] In order to make the content of the present invention clearer and easier to understand, the content of the present invention will be described in detail below in conjunction with specific embodiments and accompanying drawings.

[0028] figure 1 and figure 2 It schematically shows the split cylinder resonator used in the method for testing the dielectric properties of dielectric materials according to the preferred embodiment of the present invention.

[0029] like figure 1 and figure 2 As shown, the split cylindrical resonant cavity according to the preferred embodiment of the present invention includes: an upper cylindrical resonant cavity 100 and a lower cylindrical resonant cavity 200 separated from each other.

[0030] Wherein, the upper cylindrical resonant cavity 100 includes an upper cylindrical cavity 101 with one end closed and one end open, a pair of upper strip conductor flanges 102 arranged on the open end of the upper cylindrical cavity 101, and a pair...

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Abstract

A dielectric property testing method for dielectric materials includes connecting an upper coaxial transmission line and a lower coaxial transmission line with a vector network analyzer, enabling an upper cylindrical resonance cavity and a lower cylindrical resonance cavity to be aligned to each other and contact, stimulating a TE0np resonance mode in the cylindrical resonance cavity so that insertion loss of resonance peak in the upper cylindrical resonance cavity and the lower cylindrical resonance cavity is at the minimum, and measuring cavity resonance frequency and quality factor; arranging a dielectric substrate to be tested between an upper strip-shaped conductor flange and a lower strip-shaped conductor flange; stimulating the TE0np resonance mode in the cylindrical resonance cavities and adjusting a coupling ring to enable the insertion loss of the resonance peak in the upper and lower cylindrical resonance cavities to be the minimum, and measuring the prediction value of relative dielectric constant of the dielectric substrate to be tested; calculating dielectric property parameter value of the dielectric materials of the dielectric substrate to be tested.

Description

technical field [0001] The invention relates to the field of testing the dielectric properties of high-frequency printed board substrates, more specifically, the invention relates to a method for testing the dielectric properties of dielectric materials using split cylinder resonators, which can be used, for example, to measure high-frequency Dielectric properties of printed substrates. Background technique [0002] Dielectric properties are one of the important performance parameters of high-frequency printed substrates. Accurately testing the dielectric properties of high-frequency printed substrates is crucial to high-frequency circuit design, production, finalization and debugging of high-frequency electronic products For some applications, the test accuracy of the dielectric constant of the printed board is required to be within 2%. [0003] The test accuracy of dielectric properties is related to factors such as frequency, uniformity, anisotropy, temperature, surface ...

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Application Information

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IPC IPC(8): G01R27/26
Inventor 贾燕张永华邬宁彪陈文录李小明石小传刘立国李建荣
Owner JIANGNAN INST OF COMPUTING TECH
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