Method for testing dielectric properties by using strip-line resonance method

Abstract

A method for testing dielectric properties by using a strip-line resonance method comprises the following steps of manufacturing laminated testing samples; clamping the laminated testing samples by using a testing clamp; uniformly applying pressure to the testing clamp by using a pressure device so as to remove residual air in the laminated testing samples; fixing a first coupling device and a second coupling device on a first displacement table and a second displacement table; connecting the first coupling device and the second coupling device to a vector network analyzer by using coaxial transmission lines respectively; optimally coupling the first coupling device and the testing clamp and optimally coupling the second coupling device and the testing clamp under the assistance of a vision amplification system; stimulating a strip-line resonator by using the vector network analyzer to generate resonance; transmitting resonance signals to the laminated testing samples by using the first coupling device and the second coupling device; receiving testing result data acquired from the laminated testing samples by using the vector network analyzer; transmitting the testing result data to a control processing device; and processing the testing result data by using the control processing device so as to determine the dielectric properties of the laminated testing samples.

Description

technical field [0001] The invention relates to the field of dielectric property testing, and more specifically, the invention relates to a strip line resonance method dielectric property testing method. Background technique [0002] Dielectric properties are one of the important performance parameters of high-frequency printed substrates. Accurately testing the dielectric properties of high-frequency printed substrates is crucial to high-frequency circuit design, production, finalization and debugging of high-frequency electronic products For some applications, the test accuracy of the dielectric constant of the printed board is required to be within 2%. [0003] The test accuracy of dielectric properties is related to factors such as frequency, uniformity, anisotropy, temperature, surface roughness, etc. For anisotropic materials, the direction of the test field is crucial. The high-frequency printing substrate is an anisotropic material composed of multi-components such ...

AI Technical Summary

Problems solved by technology

[0004] Although the research on dielectric property test methods has been reported in the literature since the middle of last century, with the continuous increase of test frequency and the continuous development of materials, many test methods are not suitable for high-frequency printed substrates

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