System for testing dielectric properties by using strip line testing method

Abstract

The invention provides a system for testing dielectric properties by using a strip line testing method. The system comprises laminated testing samples, a testing clamp, a pressure device, a first coupling device, a second coupling device, a first displacement table, a second displacement table, a vision amplification system, a vector network analyzer and a control processing device, wherein the testing clamp is used for clamping the laminated testing samples; the pressure device is used for applying pressure to the testing clamp so as to remove residual air in the laminated testing samples; the first coupling device is coupled with a first end of the testing clamp; the second coupling device is coupled with a second end of the testing clamp; the first displacement table is fixed with the first coupling device; the second displacement table is fixed with the second coupling device; the vision amplification system is used for assisting in coupling between the testing clamp and the first coupling device and coupling between the testing clamp and the second coupling device; the vector network analyzer is connected with the first coupling device and the second coupling device; and the control processing device is connected with the vector network analyzer.

Description

technical field [0001] The invention relates to the field of dielectric property testing, and more specifically, the invention relates to a strip line method dielectric property testing system. Background technique [0002] Dielectric properties are one of the important performance parameters of high-frequency printed substrates. Accurately testing the dielectric properties of high-frequency printed substrates is crucial to high-frequency circuit design, production, finalization and debugging of high-frequency electronic products For some applications, the test accuracy of the dielectric constant of the printed board is required to be within 2%. [0003] The test accuracy of dielectric properties is related to factors such as frequency, uniformity, anisotropy, temperature, surface roughness, etc. For anisotropic materials, the direction of the test field is crucial. The high-frequency printing substrate is an anisotropic material composed of multi-components such as organic...

AI Technical Summary

Problems solved by technology

[0004] Although the research on dielectric property test methods has been reported in the literature since the middle of last century, with the continuous increase of test frequency and the continuous development of materials, many test methods are not suitable for high-frequency printed substrates

Images