Electronic chip test system, method and apparatus

Abstract

The present invention discloses an electronic chip test system, method and apparatus. The system comprises a programmable processor, a to-be-tested chip and a controller, wherein the programmable processor is used for preprocessing a test image to obtain a sub-image of the test image or a gray value of the pixel points and sending the sub-image of the test image or the gray value of the pixel points to the to-be-tested chip, and the test image is used for testing the to-be-tested chip; the to-be-tested chip is used for restoring the test image according to the sub-image of the test image or the gray value of the pixel points output by the programmable processor, and performing test by using the test image; and the controller is used for controlling the test process of the to-be-tested chip. The system, method and apparatus provided by the invention solve the technical problems of relatively high cost of hardware of an automatic test system and relatively long cycle of software development caused by internal flash and DDR memory modules of the automatic test system in related art.

Description

technical field [0001] The present invention relates to the field of electronic technology, in particular to a test system, method and device for an electronic chip. Background technique [0002] As the types of electronic chips continue to increase, it is necessary to ensure the quality of the performance of electronic chips during the mass production of electronic chips. Automatic test equipment for electronic chips is a device that automatically tests the performance of electronic chips, mainly including testing electronic chip leakage, electrical characteristics, high and low voltage, internal logic layout, pin on / off, clock range or receiving performance, etc. figure 1 is a schematic diagram of a testing device for an electronic chip according to the prior art, such as figure 1 As shown, in order to test the image processing performance of the electronic chip, the test equipment stores images of different high resolutions in the flash, and writes the double-rate synchr...

AI Technical Summary

Problems solved by technology

[0008] The embodiment of the present invention provides a test system, method and device for an electronic chip, to at least solve the problem that the automatic test system for an electronic chip in the related art is equipped with flash and DDR memory modules inside, resulting in high hardware cost of the automatic test system , Technical issues with long software development cycle

Images