Multi-channel T/R assembly testing device and method

Abstract

The invention discloses a multi-channel T/R assembly testing device and method. The multi-channel T/R assembly testing device comprises a received-transmitted signal separation network, and is characterized in that the received-transmitted signal separation network comprises at least one combiner, each shunting end of the combiner is connected with a transmission output/reception input end of a multi-channel T/R assembly through a four-port network, and transmission input/reception output ends of the multi-channel T/R assembly are connected with a T/R assembly performance testing instrument through an instrument distribution network; combining ends of the combiners are also connected with the T/R assembly performance testing instrument through the instrument distribution network; the instrument distribution network is further connected with a signal source, and the signal source is used for providing input signals for the multi-channel T/R assembly; both the received-transmitted signal separation network and the instrument distribution network are connected with a controller; and the four-port network comprises two operating states, wherein one of the operating states is to form two vertical microwave channels, and the other operating state is to form two transverse microwave channels.

Description

Technical field [0001] The invention belongs to the technical field of testing, and particularly relates to a multi-channel T / R component testing device and method. Background technique [0002] With the rapid development of microwave and millimeter wave integration technology, multi-channel has become one of the development trends of T / R components. In the development and production process of multi-channel T / R components, in addition to testing the performance indicators of a single T / R, it also needs Test the performance indicators between multiple T / R components, and at the same time, as a multi-channel T / R array composed of multiple T / R components, it also puts forward verification requirements for the combined power. [0003] Based on the variety and quantity of performance indicators of multi-channel T / R components, the test time requirement is high. At present, the test of multi-channel T / R components generally adopts automatic test schemes. In automatic test systems, it is...

AI Technical Summary

Problems solved by technology

[0005] At present, the design idea of ​​integrating switch, combining and attenuation is adopted. The switch combination is relatively large and the cost is high. At the same time, in order to verify the combining power, it is necessary to perform matching processing on the combining path. The difficulty and workload of debugging are very high. Large, relatively high labor costs, and at the same time, due to the large scale, it has brought great challenges to testability and maintainability.

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