Three-dimensional static testing device for infrared obscuring ratio of disturbing particles and testing method of three-dimensional static testing device

A technique for interfering particles and static testing, applied in measuring devices, material analysis through optical means, instruments, etc., can solve the problem that the number of particles that can adhere to viscous substrates is limited, the uniformity of dispersion is not easy to control, and the surface density cannot be set arbitrarily and adjustment problems to achieve the effect of overcoming bulky, simple testing and high accuracy

Active Publication Date: 2017-05-10
ELECTRONICS ENG COLLEGE PLA
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  • Application Information

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Problems solved by technology

[0007] Although this static two-dimensional plane test method is simple, convenient, and consumes less samples, it often cannot more realistically simulate the distribution of particles in three-dimensional space, the uniformity of dispersion is not easy to control, and the number of particles that can adhere to the viscous substrate is limited. , the surface density cannot be set and adjusted arbitrarily, and the test results often cannot objectively reflect the real situation

Method used

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  • Three-dimensional static testing device for infrared obscuring ratio of disturbing particles and testing method of three-dimensional static testing device
  • Three-dimensional static testing device for infrared obscuring ratio of disturbing particles and testing method of three-dimensional static testing device
  • Three-dimensional static testing device for infrared obscuring ratio of disturbing particles and testing method of three-dimensional static testing device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0058] Weigh 200±0.1 mg of interfering particles A and put them into the particle dispenser 1; through the mechanical vibration of the particle dispenser 1, the interfering particles A will fall freely and be evenly dispersed on five blank samples 2 with a diameter of 25 cm. Cheng has 4.0746g / m 2 A test sample 3 that disturbs the surface density distribution of particles; place the test sample 3 on a square frame 4 with a four-legged support.

[0059] Repeatedly produce the second to fifth test samples 3, align the four legs of the second square frame 4 with four-legged brackets with the four legs of the first square frame 4 with four-legged brackets, and stack them on the first square frame with four-legged brackets. On the square frame 4 of the leg support, place the second test sample 3 on the second square frame 4 with four-leg support, repeat the above operations to form a figure 2 The three-dimensional test structure shown.

[0060] Place the infrared radiation source...

Embodiment 2

[0063] Weigh 200±0.1 mg of interfering particles B, repeat the test and calculation steps in Example 1, and obtain the test results of the infrared shielding rate of interfering particles B, as shown in Table 1.

Embodiment 3

[0065] Weigh 200±0.1 mg of interfering particles C, repeat the test and calculation steps in Example 1, and obtain the test results of the infrared shielding rate of interfering particles C, see Table 1.

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Abstract

The invention provides a three-dimensional static testing device for the infrared obscuring ratio of disturbing particles. The three-dimensional static testing device comprises a particle dispenser, an infrared radiation source, a thermal infrared imager, a plurality of bracket frames and a blank sample board, wherein the particle dispenser is used for uniformly dispersing the disturbing particles to the blank sample board so as to prepare a test sample board; the bracket frames are used for respectively placing the blank sample board and the test sample board in a one-to-one correspondence manner under a particle obscuring condition or not and are respectively and sequentially overlapped to form a three-dimensional testing structure; the infrared radiation source is placed below the three-dimensional testing structure; and the thermal infrared imager is placed above the three-dimensional testing structure. The invention further provides a testing method of the three-dimensional static testing device for the infrared obscuring ratio of the disturbing particles. According to the three-dimensional static testing device, the defect of a big testing error of a two-dimensional static testing device is overcome, the defects of huge volume, high consumed sample amount and tediousness in operation of a traditional smoke chamber experiment system are overcome, the testing of the infrared obscuring ratio of the disturbing particles is simplified, and the precision is relatively high.

Description

technical field [0001] The invention relates to the technical field of testing the attenuation characteristics of aerosol particles and smoke particles, in particular to a three-dimensional static testing device and a testing method for the infrared shielding rate of interfering particles. Background technique [0002] Aerosol or smoke particles can absorb and scatter incident infrared radiation, causing attenuation of infrared radiation transmission. The infrared radiation distribution of the target and the background before and after attenuation and the equivalent radiation temperature of the specified point can be obtained with the help of the infrared thermal imager, so as to realize the qualitative and quantitative characterization of the interference effect. [0003] The current commonly used device for testing the infrared shielding performance of smoke particles is the smoke box test system, which consists of a large smoke box (or smoke room), smoke agent, smoke gene...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/17
CPCG01N21/171Y02A90/10
Inventor 李晓霞郭宇翔冯云松马德跃程正东朱斌邓潘
Owner ELECTRONICS ENG COLLEGE PLA
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