A dynamic parameter calibration device and method for a stability measurement device of an optoelectronic stabilization system

A system stabilization and measurement device technology, applied in the field of optical testing, can solve the problems of not being able to reflect the dynamic characteristics of the system, calibration, and not suitable for the dynamic parameters of the photoelectric stabilization system, so as to achieve the effect of solving dynamic parameter calibration and realizing dynamic angle deflection

Active Publication Date: 2020-06-09
THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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Problems solved by technology

[0004] At present, most of the photoelectric stabilization system stability measurement devices established by scientific research institutes and testing departments are special-purpose testing equipment. In order to ensure reliable performance and accurate and unified parameter values, it is necessary to solve the problem of traceability. The photoelectric autocollimator has established some calibration specifications and calibration devices, but these calibration devices mainly solve the small-angle traceability under static conditions, and are not suitable for the dynamic parameter calibration of the stability measurement device of the photoelectric stabilization system. At the same time, some test documents The photoelectric theodolite was used to calibrate the stability measurement device of the photoelectric stabilization system, but only the angle calibration was completed, and it could not reflect the dynamic characteristics of the system, so it was difficult to meet the requirements
[0005] To sum up, in the prior art, there is still no effective solution for the calibration of dynamic parameters suitable for the stability measurement device of the electro-optical stabilization system.

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  • A dynamic parameter calibration device and method for a stability measurement device of an optoelectronic stabilization system
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  • A dynamic parameter calibration device and method for a stability measurement device of an optoelectronic stabilization system

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[0051] It should be pointed out that the following detailed description is exemplary and intended to provide further explanation to the present application. Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs.

[0052] It should be noted that the terminology used here is only for describing specific implementations, and is not intended to limit the exemplary implementations according to the present application. As used herein, unless the context clearly dictates otherwise, the singular is intended to include the plural, and it should also be understood that when the terms "comprising" and / or "comprising" are used in this specification, they mean There are features, steps, operations, means, components and / or combinations thereof.

[0053] As introduced in the background technology, there is insufficient calibration of dynamic parameters in th...

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Abstract

The invention discloses a dynamic parameter calibration device and method for a stability measurement device of a photoelectric stabilization system. The stability measurement device of the optoelectronic stabilization system to be calibrated is fixed on a photoelectric platform, a micro-vibration generator is built, and the micro-vibration generator is turned on. , turn on the image acquisition system of the stability measurement device of the optoelectronic stabilization system to collect the position of the self-collimation image spot returned by the optical lens through the image acquisition system, and send the position of the reference image spot to the processing computer; set the micro-vibration The vibration frequency and angle offset range of the generator make the beam incident on the optical lens be sent offset; the position of the offset image spot returned by the optical lens is collected by the image acquisition system, and the offset angle of the spot is calculated. The invention realizes the dynamic calibration of the stability measurement device of the photoelectric stabilization system, and solves the problem of dynamic parameter calibration of the stability measurement device of the photoelectric stabilization system.

Description

technical field [0001] The invention belongs to the field of optical testing, and in particular relates to a dynamic parameter calibration device and method suitable for a stability measurement device of a photoelectric stabilization system. Background technique [0002] Airborne, vehicle-mounted, and ship-borne optoelectronic platforms have multi-directional, all-weather, high-tech reconnaissance and precision strike capabilities. As a fast and intuitive channel and means of obtaining information, they are widely used in military reconnaissance, space remote sensing, disaster forecasting, resource detection and other fields . As an important part of the optoelectronic platform, the photoelectric stabilization system has the function of line of sight stabilization or image stabilization to achieve precise aiming and tracking of targets, and then achieve precise strikes on targets. It is the key to modern optoelectronic weapons and equipment to achieve precise strikes techno...

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Application Information

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Patent Type & AuthorityPatents(China)
IPC IPC(8): G01M11/00
CPCG01M11/00
Inventor赵发财孙权社王国权韩忠王少水郑翔亮
OwnerTHE 41ST INST OF CHINA ELECTRONICS TECH GRP