Heat preservation test device and heat preservation test method for high temperature automatic sorting machine

Abstract

The invention provides a heat preservation test device and a heat preservation test method for a high temperature automatic sorting machine. The heat preservation test device for the high temperatureautomatic sorting machine comprises a heat preservation box body, multiple vertical upper rails, multiple vertical lower rails, a drawer hole, and a test feeding drawer, wherein the heat preservationbox body is provided with a heater, the vertical upper rails are arranged in the heat preservation box body, gradation mechanisms are arranged at the lower ends of the vertical upper rails, the numberof the vertical upper rails and the number of the vertical lower rails are the same, the vertical upper rails and the vertical lower rails are in one-to-one correspondence, and the drawer hole penetrates through the front end and the back end of the heat preservation box body. The test drawer includes a drawer body and a test end plate, wherein the drawer body is arranged in the drawer hole and is provided with test feeding mechanisms with the number being the same with the number of the vertical upper rails, the test end plate is provided with test connection heads which are in one-to-one correspondence with the test feeding mechanisms, and the test end plate is connected with the front end of the drawer body. The upper ends of the vertical upper rails stretch out of the upper end of theheat preservation box body. The lower ends of the vertical lower rails stretch out of the lower end of the heat preservation box body. The heat preservation test device for the high temperature automatic sorting machine can effectively keep the temperature for a heated integrated circuit, so that the internal temperature and the external temperature of the integrated circuit are uniform and precision of a high temperature test is relatively high.

Description

technical field [0001] The invention relates to the field of integrated circuit sorting, in particular to a heat preservation test device and heat preservation test method for a high-temperature automatic sorter. Background technique [0002] The high-temperature automatic sorting machine is used for testing and sorting integrated circuits that need to be used in a high-temperature environment; the traditional high-temperature automatic sorting machine has the problem that the heated integrated circuits cannot be effectively kept warm, resulting in uneven internal and external temperatures of integrated circuits and low high-temperature test accuracy Therefore, it is an urgent problem to be solved to design a kind of heat preservation test device and heat preservation test method for the high-temperature automatic sorting machine that the integrated circuit after heating can effectively keep warm, the temperature inside and outside the integrated circuit is uniform, and the h...

AI Technical Summary

Problems solved by technology

[0003] The object of the present invention is to overcome the shortcomings of the high-temperature automatic sorting machine that the heated integrated circuit cannot be effectively kept warm, resulting in uneven temperature inside and outside the integrated circuit and low precision of high-temperature testing, and to provide a heated integrated circuit that can Effective heat preservation, heat preservation test device and heat preservation test method for high temperature automatic sorting machine with uniform internal and external temperature of integrated circuit and high temperature test accuracy

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