Synchrotron Modulation Frequency Test Method

A cyclotron and modulation frequency technology, which is applied in the field of synchrotron modulation frequency testing, can solve the problems of large error and interference in test results, achieve accurate results and reduce the effect of influence

Active Publication Date: 2020-06-23
CHINA INSTITUTE OF ATOMIC ENERGY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, the above-mentioned modulation frequency tests are usually measured indirectly through resonant circuit parameter tests, etc., and the cavity eigenfrequency interferes with the test results during the test process, which eventually leads to large errors in the test results.

Method used

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  • Synchrotron Modulation Frequency Test Method
  • Synchrotron Modulation Frequency Test Method
  • Synchrotron Modulation Frequency Test Method

Examples

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Embodiment Construction

[0024] The present invention will be further described in detail below with reference to the examples and figures, but the embodiments of the present invention are not limited thereto.

[0025] like figure 1 As shown, it is a schematic diagram of the structure of the synchrocyclotron cavity, which adopts a half-wavelength structure. The head is the coupling end 1, the Dee plate 3 and the main vacuum chamber 4, and the coupling capacitor 2 is formed between the coupling end 1 and the Dee plate 3. Through the transmission line Connect the rotating capacitor at the tail and its rotating capacitor vacuum chamber 6. The 7 blades of the rotating capacitor stator at the tail are two layers, and the 8 blades of the rotating capacitor rotor are one layer. The 8 blades of the rotating capacitor rotor are connected to the rotating capacitor driver through the rotating shaft 9. Through the rotation of the blades of the rotating capacitor rotor 8, the equivalent capacitance of the cavity ...

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Abstract

The invention discloses a synchrocyclotron modulation frequency test method and relates to the technical field of synchrocyclotrons. The test method comprises the following steps: selecting a motion mode of a rotary capacitor as a position mode, setting a circumferential motion with a fixed step angle, and carrying out frequency scanning on the cavity of the synchrocyclotron to obtain a cavity eigenfrequency range f1~f2; selecting a frequency value f0 in the cavity eigenfrequency range and stopping a rotary capacitor driver; adjusting cavity coupling capacitance so that S11 in an S parameter of the cavity at f0 is less than -15dB; setting the signal source frequency to be f0 and the power to be 10dBm in a continuous mode, connecting an output signal to a coupling end of the cavity and connecting a cavity capacitance sampling signal to an oscilloscope; selecting the motion mode of the rotary capacitor as a speed mode, and lifting the rotational speed of the rotary capacitor to a designed rotational speed; using the oscilloscope to test and sample the time interval delta X between peaks of the cavity capacitance sampling signal, wherein 1 / delta X is the modulation frequency of the synchrocyclotron.

Description

technical field [0001] The present invention relates to the technical field of synchrocyclotron, more specifically, it relates to a modulation frequency testing method of synchrocyclotron. Background technique [0002] A cyclotron is a device that uses a magnetic field and an electric field to make charged particles perform cyclotron motion, and is repeatedly accelerated by a high-frequency electric field during the motion. It is an important instrument in high-energy physics. [0003] The main structure of the existing cyclotron is that two semicircular metal flat boxes (D-shaped boxes) are arranged in the vacuum chamber between the magnetic poles and placed oppositely, and an alternating voltage is applied to the D-shaped box, and an alternating voltage is generated in the gap. electric field. The particle source placed in the center produces charged particles, which are accelerated by the electric field. They are not affected by the electric field force in the D-shaped b...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H05H13/02
CPCG01R23/02
Inventor 李鹏展张天爵纪彬郭娟娟尹蒙
Owner CHINA INSTITUTE OF ATOMIC ENERGY
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