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LED backlight strip aging test device

An aging test and backlight technology, which is used in measurement devices, measurement device housings, lamp testing, etc., can solve the problems of uneven heating of backlight strips, affecting test results, and complex operation processes.

Inactive Publication Date: 2019-10-22
惠州市盈晖电子有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] However, in the prior art, the commonly used LED backlight strip aging test equipment heats the backlight strip unevenly, resulting in uneven heating surface of the backlight strip, which affects the test results, and it is necessary to perform aging tests on the backlight strips one by one. The operation process is complicated and the work The efficiency is low, so we propose a LED backlight strip aging test device to solve the above problems

Method used

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Embodiment

[0024] refer to Figure 1-5 , a kind of LED backlight strip aging testing device is proposed in the present embodiment, comprises box body 1, and the test chamber 2 that one side is opening is provided with on box body 1, and the bottom of box body 1 is fixedly installed with four supporting columns 3, One side of the box body 1 is rotatably equipped with a box door 4, and the bottom inner wall of the test chamber 2 is provided with a first mounting hole 5, and a first rotating shaft 6 is rotatably installed in the first mounting hole 5, and the two ends of the first rotating shaft 6 are Extending to the outside of the first installation hole 5, a motor 7 is provided below the box body 1, the output shaft end of the motor 7 is fixedly connected with the bottom end of the first rotating shaft 6, and a turntable 8 is fixedly installed on the top of the first rotating shaft 6, and the turntable 8 The top of the rotating disk 8 is fixedly installed with two fixed plates 9, and the...

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Abstract

The invention belongs to the technical field of aging test equipment and relates to an LED backlight strip aging test device. The LED backlight strip aging test device comprises a box body; a test cavity with an opening in one side is formed in the box body; four supporting columns are fixedly installed at the bottom of the box body; a box door is rotationally installed at one side of the box body; a first installation hole is formed in the inner wall of the bottom of the test cavity; a first rotary shaft is rotationally installed in the first installation hole; and two ends of the first rotary shaft extend out of the first installation hole. The LED backlight strip aging test device has the advantages of high practicability and convenience in operation. With the LED backlight strip agingtest device of the invention adopted, the adjustment of the horizontal positions of second U-shaped clamping plates can be facilitated, and therefore, the six second U-shaped clamping plates are matched with six first U-shaped clamping plates, so that six backlight strips can be clamped and fixed; the most of the surfaces of the backlight strips are in suspended states; the backlight strips can berotated slowly, so that the backlight strips are uniformly heated; and therefore, the accuracy of testing results is improved, and working efficiency is improved.

Description

technical field [0001] The invention relates to the technical field of aging testing equipment, in particular to an aging testing device for LED backlight strips. Background technique [0002] Nowadays, with the development of science and technology and the progress of society, LED lights have gradually replaced the lighting work of incandescent lamps. LED lights have the advantages of long service life, energy saving and environmental protection, high brightness, wide luminous area, low calorific value, safety and reliability, etc. LED lights The use of lamps is becoming more and more widespread. Before mass production of LED backlight strips, it is necessary to use aging test equipment to conduct aging test experiments on LED backlight strips to test the requirements for reliable service life of LED backlight strips. [0003] However, in the prior art, the commonly used LED backlight strip aging test equipment heats the backlight strip unevenly, resulting in uneven heating...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/44G01R1/02G01R1/04
CPCG01R31/44G01R1/02G01R1/0425
Inventor 郑晓辉郭计添张佳君袁宝李劲松王扬武
Owner 惠州市盈晖电子有限公司
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