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Test method for evaluating total write-in amount of SSD and computer equipment

A test method and test tool technology, applied in static memory, instruments, etc., can solve the problems of high cost, large number of samples, long test time, etc., and achieve the effect of low cost and favorable production.

Inactive Publication Date: 2019-12-06
SHENZHEN YILIAN INFORMATION SYST CO LTD
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  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, when the SSD is in the initial stage of the product development cycle, if the above method is used to measure the total data written volume of the SSD throughout the life cycle, the disadvantage of this method is obvious
First of all, this method requires a large number of samples and high cost; in addition, the test time of this method is long, which is not conducive to the rapid evaluation of the total data writing capacity of SSD products in the early stage of development

Method used

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  • Test method for evaluating total write-in amount of SSD and computer equipment

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Embodiment Construction

[0019] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are some of the embodiments of the present invention, but not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0020] It should be understood that when used in this specification and the appended claims, the terms "comprising" and "comprises" indicate the presence of described features, integers, steps, operations, elements and / or components, but do not exclude one or Presence or addition of multiple other features, integers, steps, operations, elements, components and / or collections thereof.

[0021] It should also be understood that the terminology used ...

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Abstract

The invention discloses a test method for evaluating the total write-in amount of an SSD and computer equipment. According to the method, an FIO test tool is utilized to compile a shell script, and the shell script comprises a read-write module and a monitoring module. The SSD is connected with the computer, the FIO test tool is operated, and the read-write module calculates the data write-in amount of the SSD. Meanwhile, the monitoring module monitors the life loss proportion value of the SSD in real time; and when the life loss proportion value of the SSD reaches a set value, the test is stopped. The ratio of the SSD data write-in quantity to the SSD life loss ratio value is calculated to obtain the total data write-in quantity of the SSD in the whole life cycle. The test method is rapid, low in cost, convenient and beneficial to production.

Description

technical field [0001] The invention relates to the technical field of solid-state hard drives (SSDs), more specifically to a test method and computer equipment for evaluating the total write volume of SSDs. Background technique [0002] Currently, when measuring the total amount of data written in the entire life cycle of a solid state drive (Solid State Drive, SSD), the methods described in the JESD47I, JESD218B and JESD219A standards are usually referred to. In the methods described in the above three standards, when the test confidence level is required to be 90%, and the LTPD (Lot Tolerance Percent Defective, allowed defective rate within the batch) is 1%, a minimum of 230 test samples are required, and the test The time usually takes 1000 hours. However, when the SSD is in the initial stage of the product development cycle, if the above method is used to measure the total data written volume of the SSD's entire life cycle, the disadvantage of this method is obvious. ...

Claims

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Application Information

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IPC IPC(8): G11C29/50
CPCG11C29/50
Inventor 罗发治
Owner SHENZHEN YILIAN INFORMATION SYST CO LTD
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