Flying probe test method, test device, test equipment and storage medium for pcb

Abstract

The invention belongs to the technical field of PCB testing, and relates to a PCB flying probe testing method, a testing device, testing equipment and a storage medium. The flying probe test method of the PCB includes: calculating the mechanical coordinates (c1, d1) of the first camera to the corresponding test point; calculating the mechanical coordinates (c2, d2) of the second camera to the corresponding test point; The first camera moves to the mechanical coordinates (c1, d1), obtains the contour image of the test point at the mechanical coordinates (c1, d1); calculates the mechanical coordinates (g1) of the first probe to the center of the contour image , h1); the second camera moves to the mechanical coordinates (c2, d2), and obtains the contour image of the test point at the mechanical coordinates (c2, d2); calculates the distance from the second probe to the contour image The machine coordinates of the center (g2, h2). The invention is beneficial to improving the accuracy of the flying probe to test the PCB open point.

Description

technical field [0001] The invention belongs to the technical field of PCB (Printed Circuit Board, printed circuit board) testing, and relates to a PCB flying probe testing method, a testing device, testing equipment and a storage medium. Background technique [0002] At present, PCB is gradually developing in the direction of thinner and lighter, its circuit structure is becoming more and more complex, and the requirements for reliability are getting higher and higher. Usually, after the PCB is printed, it is necessary to use probes to detect the circuit of the PCB, for example, to test whether there is an abnormal open circuit in the circuit of the PCB. [0003] In the prior art, a flying probe test method is usually used to test the open circuit point of the PCB. When the pad size of the PCB is small, the flying probe test method in the prior art cannot guarantee the accuracy of the test, so some false open points are prone to appear during the test, and it is often nece...

AI Technical Summary

Problems solved by technology

When the pad size of the PCB is small, the flying probe test method in the prior art cannot guarantee the accuracy of the test, so some false open points are prone to appear during the test, and it is often necessary to test again

However, the reason why the flying probe test method in the prior art tests a false open point is often because the probe deviates from the test point, therefore, the flying probe test method in the prior art cannot guarantee the accuracy of the secondary test

[0004] The inventor found in the process of studying the present invention that the flying probe test method in the prior art has technical problems such as low test accuracy

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