A lunar observation system

An observation system and lunar technology, applied in the field of lunar observation systems, can solve the problems of unable to observe the details of the lunar surface, it is difficult to obtain short-term stable data, and the system stability is not high, so as to improve test efficiency, improve short-term stability, and high measurement Effect of Resolution and Beam Pointing Accuracy

Active Publication Date: 2021-04-02
SHANGHAI SPACEFLIGHT INST OF TT&C & TELECOMM
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Problems solved by technology

[0004] The existing ground-based microwave remote sensing testing devices for observing the moon’s brightness temperature focus on S, X, Ka and other frequency bands with relatively low measurement resolution, low system stability, and self-noise that affects the test accuracy. Many details on the lunar surface cannot be observed. The average brightness temperature of the lunar surface can be obtained, but it is difficult to obtain accurate short-term stable data

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  • A lunar observation system
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Embodiment Construction

[0027] A lunar observation system proposed by the present invention will be described in further detail below in conjunction with the accompanying drawings and specific embodiments. Advantages and features of the present invention will be apparent from the following description and claims.

[0028] The lunar observation system provided by the present invention includes: an astronomical telescope 1 for tracking and positioning the pitch angle of the initial azimuth of the moon.

[0029] The two-dimensional scanning mechanism 3 is used for automatically tracking the movement track of the moon and scanning the moon.

[0030] The ground-based microwave radiometer 2 is set on the turntable of the two-dimensional scanning mechanism 3 . The ground-based microwave radiometer 2 includes an antenna 201 , an information unit 204 , a radiation receiver 203 and a test feed 202 . The antenna 201 receives the lunar brightness temperature signal, and separates the brightness temperature sign...

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Abstract

The invention discloses a moon observation system which is composed of an astronomical telescope, a ground-based microwave radiometer, a two-dimensional scanning mechanism and a controller. The systemis simple in structure and easy to implement. The ground-based microwave radiometer is installed on a two-dimensional turntable, the pitch angle of the initial position of the moon is obtained by theastronomical telescope, the initial position is calibrated by the controller, and the two-dimensional turntable is controlled to automatically track and scan the track of the moon; the moon brightness temperature signal is reflected by the antenna to enter an antenna feed system and enters a radiation receiver after polarization separation, and a voltage acquisition signal and a variance curve can be obtained in real time after detection and the moon brightness temperature value can also be calculated and thus the test efficiency can be effectively improved. The moon observation system has certain universality and can be applied to moon brightness temperature measurement based on ground-based microwave radiometers of different frequency bands to explore the stability and time distributioncharacteristics of microwave radiation characteristics.

Description

technical field [0001] The invention belongs to the field of lunar observation equipment, in particular to a lunar observation system. Background technique [0002] The moon is the closest natural celestial body to the earth, and its surface has excellent radiation stability. Once the change of lunar radiation is accurately determined, the moon can be used as a long-term calibration source for space remote sensors. The regolith layer on the lunar surface has long been impacted by meteorites and radiated by solar cosmic rays, storing the history of lunar geology and solar radiation activities. Because the lunar soil is a low-loss medium, microwave remote sensing can detect the depth of several meters; passive remote sensing consumes less energy, and the existing microwave radiation technology can be realized. How to accurately and efficiently measure the brightness temperature of the lunar surface radiation is an important issue in lunar exploration. [0003] At present, th...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J5/00
CPCG01J5/00
Inventor 杨永键李向芹谢振超李尊良邙晓斌钱志鹏
Owner SHANGHAI SPACEFLIGHT INST OF TT&C & TELECOMM
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