Microcontroller working state obtaining method, device and system and readable storage medium

A microcontroller and working state technology, which is applied in the general control system, control/regulation system, program control, etc., can solve the problem that testers cannot accurately know the working state of the MCU in real time

Pending Publication Date: 2020-09-04
SHANGHAI EASTSOFT MICROELECTRONICS +1
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The technical problem solved by the embodiment of the present invention is that when debugging the application system of the MCU, the tester cannot accurately know the current specific working state of the MCU in real time.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Microcontroller working state obtaining method, device and system and readable storage medium
  • Microcontroller working state obtaining method, device and system and readable storage medium
  • Microcontroller working state obtaining method, device and system and readable storage medium

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0021] In practical applications, when using the online debugging technology to debug the application system of the MCU, testers cannot know the specific working status of the MCU in real time.

[0022] In the embodiment of the present invention, the current and voltage of the microcontroller and its corresponding first time stamp set are obtained, and the sleep wake-up event output by the microcontroller and its corresponding second time stamp, Program running events output by the microcontroller and their corresponding third time stamps. Plot the average transient power consumption of the microcontroller against the current and voltage of the microcontroller, and calculate the average transient power consumption for each event. On the average transient power consumption curve, marking each dormancy wake-up event and each program running event can enable testers to know the specific working state of the microcontroller in real time and intuitively.

[0023] In order to make ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a microcontroller working state obtaining method, device and system and a readable storage medium. The obtaining method comprises the steps: acquiring the current and voltage of a microcontroller and a first timestamp set corresponding to the obtained current and voltage; searching a sleep wake-up event output by the microcontroller, a second timestamp corresponding to thesleep wake-up event, a program running event output by the microcontroller and a third timestamp corresponding to the program running event from the first timestamp set; calculating average transientpower consumption of the microcontroller according to the current and the voltage of the microcontroller, and drawing an average transient power consumption curve of the microcontroller; calculating average transient power consumption corresponding to each event according to the second timestamp, the third timestamp and the current and voltage of the microcontroller; and identifying a sleep wake-up event and a program running event on the average transient power consumption curve. According to the scheme, a tester can accurately know the specific working state of the MCU in real time.

Description

technical field [0001] The invention relates to the technical field of microcontrollers, in particular to a method, device, system, and readable storage medium for acquiring the working state of a microcontroller. Background technique [0002] With the development of the Internet of Things (Internet of Things, IoT) technology, a variety of IoT products are derived, and the IoT products have higher and higher power consumption requirements for a microcontroller (Microcontroller Unit, MCU). Therefore, it is necessary to debug the MCU to measure the specific power consumption of the MCU. [0003] In the prior art, the online debugging technology is usually used to debug the application system of the MCU online. However, when using online debugging technology to debug the application system of the MCU, testers cannot accurately know the current specific working status of the MCU in real time, including sleep mode, power consumption, etc. Contents of the invention [0004] Th...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G05B19/042
CPCG05B19/0423G05B2219/25257
Inventor 朱晓飞李保海万峰陈光胜张旭华
Owner SHANGHAI EASTSOFT MICROELECTRONICS
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products